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Application Of Build-in Self Test In Functional Test Of DSL

Technical Library | 2012-05-23 14:16:41.0

first published in the 2012 IPC APEX EXPO technical conference proceedings. BIST (build-in self test ) is the technique of designing additional hardware and software features into integrated circuits to allow them to perform self-testing, i.e., testing of

Flex (Flextronics International)

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