Technical Library: a and camera (Page 13 of 29)

Cleanliness of Stencils and Cleaned Misprinted Circuit Boards

Technical Library | 2010-09-09 16:44:48.0

The effectiveness of cleaning stencils and misprinted/dirty printed circuit boards can be effectively monitored. This can be done by washing known clean circuit boards and then checking to see if they have stayed clean as a result of the washing process.

Research In Motion

Assembly and Rework of Lead Free Package on Package Technology

Technical Library | 2012-03-22 20:40:01.0

Miniaturization continues to be a driving force in both integrated circuit packaging and printed circuit board laminate technology. In addition to decreasing component pitch (lead to lead spacing), utilization of the vertical space by stacking packages ha

Electronics

PCB Assembly With Obsolete Parts and Hard-To-Find Components

Technical Library | 2018-03-13 14:12:34.0

Many companies take their supply chain for granted until they need an obsolete part or a hard-to-find component. Then the importance of having resourceful contract manufacturing partners becomes an incredibly valuable asset.

Power Design Services

SMT chip capacitor resistor storage and processing method

Technical Library | 2022-04-27 01:34:43.0

SMD capacitors and resistors have small sizes and many models. Some manufacturers buy a lot of products and do not use them up in time. The problem of storage is always a headache. So how should chip capacitors and resistors be stored? There are also precautions when using chip capacitors. Please see the following information and hope it will help you.

Leaderway Industrial Co.,Ltd

Solar Panel Design Decision and General Information Sheet

Technical Library | 2014-04-10 18:04:04.0

This paper is meant to be a guide and a reference to new and old members alike who wish to know about, understand, and improve on the decisions made and processes implemented to build the current solar panels. The following paragraphs in the introduction will lay out background information on solar panels and cube satellites. This entire document was written with the idea that the reader will be able to follow the decisions made to construct the solar panels and then with this knowledge find areas of the project for improvement.

iSAT Group

Print Performance Studies Comparing Electroform and Laser-Cut Stencils

Technical Library | 2015-11-05 15:09:27.0

There has been recent activity and interest in Laser-Cut Electroform blank foils as an alternative to normal Electroform stencils. The present study will investigate and compare the print performance in terms of % paste transfer as well the dispersion in paste transfer volume for a variety of Electroform and Laser-Cut stencils with and without post processing treatments. Side wall quality will also be investigated in detail. A Jabil solder paste qualification test board will be used as the PCB test vehicle.

Photo Stencil LLC

List of Problems and Solutions for Centrifugal Air Compressor

Technical Library | 2021-12-22 01:35:51.0

As a speed type air compressor, centrifugal compressor can generate air flow moving in radial direction. Centrifugal air compressors are used by a large number of companies today because of their high-pressure tightness. Therefore, common faults in the operation have become one of the most concerned issues for users. This article will discuss causes of centrifugal compressor failures and give corresponding maintenance measures. At the end, OKmarts has listed the problems and solutions in detail for your quick reference.

OKmarts Industrial Parts Mall

Air purification and occupational health & safety in electronics production

Technical Library | 2021-04-16 05:38:38.0

The overall process of manufacturing electronics assemblies is characterized by a number of very different procedures. Along the production chain, technologies for cutting, assembling, soldering, bonding, gluing, marking, potting, etc. are used, all of them have one thing in common: They produce airborne pollutants, some of which can have a significant impact on employees, manufacturing equipment and products - and for this reason need to be removed effectively and efficiently.

ULT Canada Sales Incorporated

Causes and Costs of No Fault Found Events

Technical Library | 2016-04-14 13:49:44.0

A system level test, usually built-in test (BIT), determines that one or more subsystems are faulty. These subsystems sent to the depot or factory repair facility, called units under test (UUTs) often pass that test, an event we call No-Fault-Found (NFF). With more-and more electronics monitored by BIT, it is more likely that an intermittent glitch will trigger a call for a maintenance action resulting in NFF. NFFs are often confused with false alarm (FA), cannot duplicate (CNDs)or retest OK (RTOK) events. NFFs at the depot are caused by FAs, CNDs, RTOKs as well as a number of other complications. Attempting to repair NFF scan waste precious resources, compromise confidence in the product, create customer dissatisfaction, and the repair quality remains a mystery. The problem is compounded by previous work showing that most failure indications calling for repair action at the system level are invalid. NFFs can be caused by real failures or may be a result of system level false alarms. Understanding the cause of the problem may help us distinguish between units under test (UUTs) that we can repair and those that we cannot. In calculating the true cost of repair we must account for wasted effort in attempting to repair unrepairable UUTs.This paper will shed some light on this trade-off. Finally, we will explore approaches for dealing with the NFF issue in a cost effective manner.

A.T.E. Solutions, Inc.

Reliability of Embedded Planar Capacitors under Temperature and Voltage Stress

Technical Library | 2015-05-21 18:46:31.0

In this work the reliability of an embedded planar capacitor laminate under temperature and voltage stress is investigated. The capacitor laminate consisted of an epoxy-BaTiO3 composite sandwiched between two layers of copper. The test vehicle with the embedded capacitors was subjected to a temperature of 125oC and a voltage bias of 200 V for 1000 hours. Capacitance, dissipation factor, and insulation resistance were monitored in-situ. Failed capacitors exhibited a sharp drop in insulation resistance, indicating avalanche breakdown. The decrease in the capacitance after 1000 hours was no more than 8% for any of the devices monitored. The decrease in the capacitance was attributed to delamination in the embedded capacitor laminate and an increase in the spacing between the copper layers.

CALCE Center for Advanced Life Cycle Engineering


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