Technical Library: any (Page 8 of 10)

The Impact of New Generation Chemical Treatment Systems on High Frequency Signal Integrity

Technical Library | 2019-02-20 16:35:24.0

The High Density Packaging (HDP) User Group has completed a project evaluating the high frequency loss impacts of a variety of imaged core surface treatments (bond enhancement treatments, including chemical bonding and newer low etch alternative oxides) applied just prior to press lamination. Initial high frequency Dk/Df electrical test results did not show a strong correlation with any of the methods utilized within this project to measured surface roughness. The more significant factor affecting the measured loss is the choice of pre-lamination surface treatment. Most of the new chemical treatment systems outperform the older existing systems which depend upon surface roughness techniques to promote adhesion.

Sanmina-SCI

Effect Of Voids On Thermo-Mechanical Reliability of Solder Joints

Technical Library | 2019-10-16 23:18:15.0

Despite being a continuous subject of discussion, the existence of voids and their effect on solder joint reliability has always been controversial. In this work we revisit previous works on the various types of voids, their origins and their effect on thermo-mechanical properties of solder joints. We focus on macro voids, intermetallics micro voids, and shrinkage voids, which result from solder paste and alloy characteristics. We compare results from the literature to our own experimental data, and use fatigue-crack initiation and propagation theory to support our findings. Through a series of examples, we show that size and location of macro voids are not the primary factor affecting solder joint mechanical and thermal fatigue life. Indeed, we observe that when these voids area conforms to the IPC-A-610 (D or F) or IPC-7095A standards, macro voids do not have any significant effect on thermal cycling or drop shock performance.

Alpha Assembly Solutions

Essentials about Printed Circuit Board Assembly

Technical Library | 2019-10-18 10:37:25.0

It usually does not make any logic to invest in costly fabrication equipment in case you just desire to spin some prototypes and rather outsource your Printed Circuit Board assembly as well as prototype fabrication to a trustworthy vendor. I would provide a few tips as to what to consider when seeking a contract manufacturer. The two most common procedures associated with Printed Circuit Board Assembly are through-hole technology and surface mount technology. Talking about the difference between through-hole technology and surface mount technology. Through-hole elements have metal leads, & these metal leads are supplied through-plated holes inside the circuit board. On the other hand, SMT elements might or might not have leads, nevertheless most significantly, they are developed to be soldered onto the surface of the circuit boards straight on the same side as the element body. A lot of contract manufacturers would provide a quick quote mechanism over their site for the fabrication of circuit boards as well as assembly of prototypes. This would bank your time when comparing various vendors. Ensure that the quote system facilitates you to fill your details, for instance, board material, thickness, copper thickness, milling, etc. in order that you can avail of a precise quote devoid of any surprises afterward. And this is quite necessary. Typically the cost per board would decline as quality upgrades. This is owing to the fairly high setup price of circuit board fabrication over and above component assembly. A few vendors would employ a system where they unite boards from various consumers. This manner the setup price would be circulated among numerous clients. When you fabricate an item, you clearly don’t desire to have to fabricate a big quantity of boards straight away whilst you improve your design. One restriction with small quantity prototypes though is that the option of materials & material thicknesses would be constrained. In case you are employing a particular material then opportunities are there will not be any other clients employing the same material. Additionally, lead time plays a major role in indecisive prices. A longer lead time facilitates the fabricator more liberty in slotting your fabrication. This is basically reflected in cheaper prices that would view in the quote section. Clearly, if you are in a hurry and desire to be moved to the summit of the pile you would require splurging more dollars. Ensure that your contract fabricator would support the file sort for producing which you offer. The most general format for printed circuit board fabrication is the Gerber format nonetheless a few vendors would moreover embrace board files from general printed circuit board software products. A few suppliers also provide in house printed circuit design. Even in case, you create your board yourself, choosing a vendor with design services might prove resourceful in case there is an issue with your files. In this scenario, your vendor could make swift changes that would neglect pricey delays. If you are looking for an Electronic Manufacturing Services (EMS Assembly) provider, then the web is the best to search.

Optima Technology Associates, Inc.

Creating Reusable Manufacturing Tests for High-Speed I/O with Synthetic Instruments

Technical Library | 2020-07-08 20:05:59.0

There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.

A.T.E. Solutions, Inc.

Database Driven Multi Media Work Instructions

Technical Library | 2019-03-25 12:45:56.0

Work instructions are time consuming to generate for engineers, often requiring regeneration from scratch to address very minor changes. They need to be produced in varying levels of detail, with varying guidelines, for multiple stations, operators and lines. Minor component, station or process changes – down to the modification of an individual BOM component – can cause headaches when attempting to maintain consistency across multiple work instructions that are touched by the change.The solution presented here improves efficiency and saves engineering time by making use of a database driven approach. Manufacturing details, component information, process guidelines, annotations, machine-specific data, and more can be stored in one central database. Any information stored in this single repository can then be modified quickly in one location and automatically propagate seamlessly throughout multiple work instructions. These can be instantly printed out or displayed on screens at appropriately affected stations with the simple click of a button, as opposed to regenerating from scratch, or going in and reviewing many documents to find and update with the change.

Optimal Electronics Corporation

101 EMI Shielding Tips and Tricks

Technical Library | 2020-07-02 13:16:32.0

Principle of shielding 1 The principle of shielding is creating a conductive layer completely surrounding the object you want to shield. This was invented by Michael Faraday and this system is known as a Faraday Cage. 2 Ideally, the shielding layer will be made up of conductive sheets or layers of metal that are connected by means of welding or soldering, without any interruptions. The shielding is perfect when there is no difference in conductivity between the used materials. When dealing with frequencies below 30 MHz, the metal thickness affects shielding effectiveness. We also offer a range of shielding methods for plastic enclosures. A complete absence of interruptions is not a realistic goal since the Faraday cage will have to be opened from time to time so electronics, equipment or people can be moved in or out. Openings are also needed for displays, ventilation, cooling, power supply, signals etc. 3 Shielding works in both directions, items inside the shielded room are shielded from outside influences. (Fig. 3.1)

Holland Shielding Systems BV

Maximal Performance Through Vacuum Potting

Technical Library | 2021-07-28 18:35:13.0

The performance of electronic components is compromised by factors such as bubbles in the potting medium. Increasing numbers of applications – particularly in the automotive and electronics industries – therefore require completely bubble-free dispensing methods. This is where potting in a vacuum comes into focus. The widespread school of thought about this technology is that it is too complicated, too expensive and too slow. But a closer look shows that this view is incorrect. This is a mastered technology. As for costs, the calculation basis is key, since usually the potting and vacuum method is only considered after the required potting quality cannot be achieved reliably any other way. Under total cost of ownership assessments, higher system costs no longer play a key role, since component failure would result in much higher subsequent costs. And now there are proven solutions for high production volumes and/or shorter cycle times. This whitepaper explains when potting in a vacuum is ideal for your projects and what to be aware of.

Scheugenpflug Inc.

Reliability Study of Bottom Terminated Components

Technical Library | 2015-07-14 13:19:10.0

Bottom terminated components (BTC) are leadless components where terminations are protectively plated on the underside of the package. They are all slightly different and have different names, such as QFN (quad flat no lead), DFN (dual flat no lead), LGA (land grid array) and MLF (micro lead-frame. BTC assembly has increased rapidly in recent years. This type of package is attractive due to its low cost and good performance like improved signal speeds and enhanced thermal performance. However, bottom terminated components do not have any leads to absorb the stress and strain on the solder joints. It relies on the correct amount of solder deposited during the assembly process for having a good solder joint quality and reliable reliability. Voiding is typically seen on the BTC solder joint, especially on the thermal pad of the component. Voiding creates a major concern on BTC component’s solder joint reliability. There is no current industry standard on the voiding criteria for bottom terminated component. The impact of voiding on solder joint reliability and the impact of voiding on the heat transfer characteristics at BTC component are not well understood. This paper will present some data to address these concerns.

Flex (Flextronics International)

The Evolution of Surface Finishes in Mobile Phone Applications

Technical Library | 2017-02-28 12:39:50.0

During the last 5 years mobile phones and other portable consumer electronics have been extremely popular and spread all over the world in different climate zones in very high volumes. At the same time the mobile phone terminal for many people has become a necessity that is brought with them in any activity they practice. These changes in user behavior have heavily changed the impact on handheld terminals from moisture, sweat, corrosive atmospheres and mechanical drop. As a result of this the requirement to solder joint reliability, corrosion stability and wear resistance are heavily increasing to keep a high reliability of the terminal.Immersion Ni/Au has been the overall dominant surface finish on Printed Wiring Boards (PWB's) for the last 10 years, but a paradigm shift to avoid use of this thin and porous surface finish is ongoing nowadays because it can’t address these challenges in a satisfactory way.In today's handheld terminals, Organic Solder Preservative (OSP) has replaced Immersion Ni/Au on solder pads. Carbon surface finish for Key- and spring contact-pads, combined with the right concept design can make use of Immersion Ni/Au unnecessary in the near future. The result will be higher reliability with less expensive and simpler processes.This paper will discuss the various considerations for choice of surface finish and results from the feasibility studies performed.

Nokia Corporation

Semi-Additive Process for Low Loss Build-Up Material in High Frequency Signal Transmission Substrates

Technical Library | 2018-04-18 23:55:01.0

Higher functionality, higher performance and higher reliability with smaller real estate are the mantras of any electronic device and the future guarantees more of the same. In order to achieve the requirements of these devices, designs must incorporate fine line and via pitch while maintain good circuitry adhesion at a smooth plating-resin interface to improve signal integrity. The Semi-Additive Process (SAP) is a production-proven method used on low dielectric loss tangent (Df) build-up materials that enables the manufacture of ultra-fine circuitry. (...) This paper will discuss a new SAP process for low loss build-up materials with low desmear roughness (Ra= 40-100 nm) and excellent adhesion (610-680 gf/cm) at various processing conditions. Along with the process flow, the current work will also present results and a discussion regarding characterization on the morphology and composition of resin and/or metal plating surfaces using scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX), surface roughness analysis, plating-resin adhesion evaluation from 90o peel tests

MacDermid Inc.


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