Technical Library | 2016-07-28 17:00:20.0
Packaging trends enable disruptive technologies. The miniaturization of components reduces the distance between conductive paths. Cleanliness of electronic hardware based on the service exposure of electrical equipment and controls can improve the reliability and cost effectiveness of the entire system. Problems resulting from leakage currents and electrochemical migration lead to unintended power disruption and intermittent performance problems due to corrosion issues.Solvent cleaning has a long history of use for cleaning electronic hardware. Limitations with solvent based cleaning agents due to environmental effects and the ability to clean new flux designs commonly used to join miniaturized components has limited the use of solvent cleaning processes for cleaning electronic hardware. To address these limitations, new solvent cleaning agents and processes have been designed to clean highly dense electronic hardware.The research study will evaluate the cleaning and electrical performance using the IPC B-52 Test Vehicle. Lead Free noclean solder paste will be used to join the components to the test vehicle. Ion Chromatography and SIR values will be reported.
Technical Library | 2014-05-29 13:48:14.0
Electronics packaging based on stress-engineered spring interconnects has the potential to enable integrated IC testing, fine pitch, and compliance not readily available with other technologies. We describe new spring contacts which simultaneously achieve low resistance ( 30 μm) in dense 2-D arrays (180 ~ 180-µm pitch). Mechanical characterization shows that individual springs operate at approximately 150-µN force. Electrical measurements and simulations imply that the interface contact resistance contribution to a single contact resistance is This paper suggests that integrated testing and packaging can be performed with the springs, enabling new capabilities for markets such as multichip modules.
Technical Library | 2021-05-06 13:48:05.0
In this paper most commonly occurring Bare PCB defects such as Track Cut, Track short and Pad Damages are detected by Image processing techniques. Reference PCB without having any defects is compared with test PCB having defects to identify the defects and x-y coordinates of the center of the defects along with radii are obtained using Difference of Gaussian method and location of the individual type of defects are marked either by similar color or different colors. Result Analysis includes time taken for the inspection of a single defect, multiple similar defects, and multiple different defects. Time taken is ranging from 1.674 to 1.714 seconds if the individual type of defects are marked by different colors and 0.670 to 0.709 seconds if all the identified defects are marked by the same colors.
Technical Library | 2020-08-13 01:12:57.0
The solar industry has driven solutions that result in electronics systems that are required to perform in outside environments for over 25 years. This industry expectation has resulted in solutions to protect the electronics from failure that can result from interaction with moisture, and various chemicals leading to corrosion and shorting of the systems. Potting and encapsulation compounds can impart the very high level of protection from environmental, thermal, chemical, mechanical, and electrical conditions that the solar applications demand.
Technical Library | 2019-11-15 02:20:26.0
Material Aging Test-UV Weathering Test Chamber 1.What is UV aging? UV aging chambers use fluorescent ultraviolet lamp as light source to simulate UV radiation and condensation in natural sunlight, and to carry out accelerated weather resistance test in order to obtain the result of weather resistance of the material. UV aging detection is widely used in non-metallic materials, organic materials (such as coatings, paints, rubber, plastics and their products) under the change of sunlight, humidity, temperature, condensation and other climatic conditions to test the aging degree and situation of related products and materials. 2.Why we should do UV aging test? When the product is placed in the ambient environment, there will be different problems taken place, such as appearance changes, including cracking, speckle, powdering or color change, and even performance degradation,which may be due to the loss of components in the resin resulting in chemical bonds changes inside the molecular structure, this is mainly caused by sunlight, industrial exclusion of waste gas, bacteria and so on. The aging performance of the product directly affects the lifespan of the product, so aging test become significant,non-metallic materials, organic materials (such as paints, paints, rubber, plastics and their products) are subject to changes in sunlight, humidity, temperature, condensation and other climatic conditions to test the degree and condition of aging of related products and materials. The natural aging test is to put the plastic specimen under the sun exposure, and it is directly under the natural climate environment,to test the material performance under various factors such as light, heat energy, atmospheric humidity, oxygen and ozone, industrial pollution and the like, the most harsh climate condition should be selected,or near the actual application area of the material, the test site shall be open and flat, no obstacle to affect the test results,the specimen holder shall be facing the equator and at an angle of 45 ° from the ground. When the main performance index of the specimen has been reduced, the test s/b terminated when it achieve the minimum allowable use value . in most case,the test is terminated when the product primary performance index falls to 50% of the initial value. The natural aging process is a very slow process, and there is a great difference in different geographical conditions, which brings difficulties to evaluate the aging resistance of the product. It is an attempt to make an evaluation of the aging performance of the plastic in a shorter time,that is accelerated aging test. The accelerated aging test can be used to simulate the human light source of the fluorescent lamp, including the carbon arc lamp, the xenon arc lamp and the fluorescent ultraviolet lamp, and the artificial light sources can generate more light than the natural sunlight on the ground. When these artificial light sources are used, it is also common to use the combination of the condenser to simulate the rain drop, the dew and the like to conduct the aging test on the product.
Technical Library | 2013-08-07 21:52:15.0
PCB architectures have continued their steep trend toward greater complexities and higher component densities. For quality control managers and test technicians, the consequence is significant. Their ability to electrically test these products is compounded with each new generation. Probe access to high density boards loaded with micro BGAs using a conventional in-circuit (bed-of-nails) test system is greatly reduced. The challenges and complexity of creating a comprehensive functional test program have all but assured that functional test will not fill the widening gap. This explains why sales of automated-optical and automated X-ray inspection (AOI and AXI) equipment have dramatically risen...
Technical Library | 2015-11-19 18:15:07.0
The move to lead free (Pb-free) electronics by the commercial industry has resulted in an increasing number of ball grid array components (BGAs) which are only available with Pb-free solder balls. The reliability of these devices is not well established when assembled using a standard tin-lead (SnPb) solder paste and reflow profile, known as a backward compatible process. Previous studies in processing mixed alloy solder joints have demonstrated the importance of using a reflow temperature high enough to achieve complete mixing of the SnPb solder paste with the Pb-free solder ball. Research has indicated that complete mixing can occur below the melting point of the Pb-free alloy and is dependent on a number of factors including solder ball composition, solder ball to solder paste ratio, and peak reflow times and temperatures. Increasing the lead content in the system enables full mixing of the solder joint with a reduced peak reflow temperature, however, previous research is conflicting regarding the effect that lead percentage has on solder joint reliability in this mixed alloy solder joint.
Technical Library | 1999-05-07 10:16:31.0
This paper will describe practical aspects of a redundancy implementation on a high-volume cache memory product. Topics covered include various aspects of redundancy from a design and product engineering perspective; and present test development methods for future product implementations.
Technical Library | 1999-04-26 11:52:34.0
An evaluation of two fluxers, one with a reciprocating ultrasonic head and the other with microjets, was performed using nine independent criteria. The paper describes the methods of testing and the results.
Technical Library | 2012-04-26 18:52:37.0
First presented at IPC Apex Expo 2012. The reliability, as tested by thermal cycling, of printed wire boards (PWB) are established by three variables; copper quality, material robustness and design. The copper quality was most influential and could be eva
