Technical Library: blocks (Page 1 of 2)

Component Shortages Causing Electronics Manufacturers to "Use All Means Necessary" to Ship Products

Technical Library | 2010-11-24 20:47:38.0

As the electronics manufacturing and assembly industry in the US recovers to some degree from the economic crisis which began in 2008, the challenge of component shortages has risen to the top as one of the stumbling blocks for contract assemblers and cap

BEST Inc.

Bad Block Management in SSD

Technical Library | 2019-01-10 05:34:07.0

Why do large number of bad blocks generate when SSDs close their lifespan? What's impact on SSDs nomral usage? And how does SSD manage the bad blocks? Just let's take a look at the bad block management in SSDs.

Renice Technology Co., Ltd

How to choose the plug of anti static IC tube and its material

Technical Library | 2019-05-09 05:40:52.0

When the anti static ic tube is produced, it is empty at both ends. Therefore, before and after the electronic components are loaded into the plastic tube, the IC hoses need to be blocked at both ends. Generally, there are plastic nails and rubber stoppers.

Shenzhen Sewate Technology Co.,Ltd

Recycling of Non-metallic Residue from Waste Printed Circuit Boards to Produce Interlocking Concrete Blocks

Technical Library | 2022-01-05 23:14:20.0

The process of copper recovery from waste printed circuit board has generated large amounts of non-metallic fraction (NMF) residue. In this research, the residue was recycled as a substitute for fine aggregates at 0%, 5%, 10%, 15%, and 20% to produce interlocking concrete blocks. Properties of the interlocking concrete blocks produced in this study, such as density, water absorption, compressive strength, were firstly examined and the selected mixes were further evaluated for the heavy metal leachability.

Mahidol University

Redundancy Yield Model for SRAMS

Technical Library | 1999-05-07 10:14:57.0

This paper describes a model developed to calculate number of redundant good die per wafer. A block redundancy scheme is used here, where the entire defective memory subarray is replaced by a redundant element. A formula is derived to calculate the amount of improvement expected after redundancy. This improvement is given in terms of the ratio of the overall good die per wafer to the original good die per wafer after considering some key factors.

Intel Corporation

Coordinating Hundreds of Cooperative, Autonomous Vehicles in Warehouses

Technical Library | 2022-01-12 19:17:37.0

Occasionally, mature industries are turned upside down by innovations. The years of research on robotics and multiagent systems are coming together to provide just such a disruption to the material-handling industry. While autonomous guided vehicles (AGVs) have been used to move material within warehouses since the 1950s, they have been used primarily to transport very large, very heavy objects like rolls of uncut paper or engine blocks.

Association for the Advancement of Artificial Intelligence

Manufacture and Characterization of a Novel Flip-Chip Package Z-interconnect Stack-up with RF Structures

Technical Library | 2008-02-26 15:02:19.0

More and more chip packages need multi-GHz RF structures to meet their performance targets. The ideal chip package needs to combine RF features with Digital features for these applications. They drive low-loss, controlled impedance transmission lines, flexibility in assigned signal and power layers, and clearances of various shapes in power layers. Building these features in a chip package is difficult without making the stack-up very thick or compromising the reliability of the product. In the present paper, we have designed and built a flip-chip package test vehicle (TV) to make new RF structures, using Z-axis interconnection (Zinterconnect) building blocks.

i3 Electronics

Conformal Surface Plasmons Propagating on Ultrathin and Flexible Films

Technical Library | 2013-09-05 17:44:14.0

Surface plasmon polaritons (SPPs) are localized surface electromagnetic waves that propagate along the interface between a metal and a dielectric. Owing to their inherent subwavelength confinement, SPPs have a strong potential to become building blocks of a type of photonic circuitry built up on 2D metal surfaces; however, SPPs are difficult to control on curved surfaces conformably and flexibly to produce advanced functional devices. Here we propose the concept of conformal surface plasmons (CSPs), surface plasmon waves that can propagate on ultrathin and flexible films to long distances in a wide broadband range from microwave to mid-infrared frequencies.

Southeast University (SEU)

Advances in Conductive Inks across Multiple Applications and Deposition Platforms

Technical Library | 2012-12-27 14:35:29.0

Printed Electronics is generally defined as the patterning of electronic materials, in solution form, onto flexible substrates, omitting any use of the photolithography, etching, and plating steps commonly found within the Printed Circuit Board (PCB) industry. The origins of printed electronics go back to the 1960s, and close variants of several original applications and market segments remain active today. Through the 1980s and 1990s Printed Electronic applications based on Membrane Touch Switch and Electroluminescent lighting technologies became common, and the screen printed electronic materials used then have formed the building blocks for many of the current and emerging technologies and applications... First published in the 2012 IPC APEX EXPO technical conference proceedings.

DuPont

Novel Pogo-Pin Socket Design for Automated Low Signal Linearity Testing of CT Detector Sensor

Technical Library | 2019-01-30 21:20:47.0

Due to the arrayed nature of the Computed Tomography (CT) Detector, high density area array interconnect solutions are critical to the functionality of the CT detector module. Specifically, the detector module sensor element, hereby known as the Multi-chip module (MCM), has a 544 position BGA area array pattern that requires precise test stimulation. A novel pogo-pin block array and corresponding motorized test socket has been designed to stimulate the MCM and acquire full functional test data. (...) This paper and presentation will focus on the socket design challenges and also key learnings from the design that can be applied to general test systems, including reliability testing. The secondary focus will be on the overall data collection and graphical user interface for the test equipment.

General Electric

  1 2 Next

blocks searches for Companies, Equipment, Machines, Suppliers & Information