Technical Library: bodies (Page 1 of 2)

How to choose a reliable CF Card for VDR

Technical Library | 2018-11-22 05:21:52.0

VDR (Voyage Data Recorder) is an instrument continuously recording real-time data of ship body, including speech communication signal of cockpit, sensors data, alarm status and radar images, etc.. So what's types of storage devices may meet VDR's requirement?

Renice Technology Co., Ltd

Printed Electronics for Medical Devices

Technical Library | 2020-11-10 15:50:20.0

As is the case with many other markets where faster, highly capable technologies have resulted in more intelligent processes and products, the medical device sector is also undergoing a "smart" transformation. This has driven the development of medical devices that provide greater access to in-home care and monitoring and faster results for medical professionals, with the overarching benefit of better patient outcomes. Devices applied to the human body that commonly sense

Henkel Electronic Materials

Autorouting Techniques for Mulitchip Modules

Technical Library | 2001-04-24 10:38:38.0

Many PCB designers are interested in taking advantage of Multichip Modules, but are unfamiliar with the technology. While the design process is very much the same, MCM manufacturing processes vary dramatically. MCM routing requirements are dictated by the manufacturing process and types of components. Components mounted on MCM substrates are predominantly, if not exclusively, bare chips. As a result, the component body and I/O pins are no longer constrained to industry standard pin counts and form factors as are packaged components...

Mentor Graphics

Electrochemical Methods to Measure the Corrosion Potential of Flux Residues

Technical Library | 2017-07-27 16:51:57.0

Reliability Expectations of Highly Dense Electronic Assemblies is commonly validated using Ion Chromatography and Surface Insulation Resistance. Surface Insulation Resistance tests resistance drops on both cleaned and non-cleaned circuit assemblies. It is well documented in the literature that SIR detects ionic residue and the potential of this residue to cause leakage currents in the presence of humidity and bias. Residues under leadless components are hard to inspect for and to ensure flux residue is totally removed. The question many assemblers consider is the risk of residues that may still be present under the body of components.

KYZEN Corporation

Factors determine the price of temperature humidity test chamber

Technical Library | 2019-12-16 22:20:55.0

When we were children,our parents always warn us "Do comparison shopping before you buy",why they say like this?this is a very simple truth, for the first deal,we are always cautious, through continuous comparison in order to find out the best quality, service, after-sale and price. This apply to any industry,there are many manufacturers of environmental test equipment. When some customers inquire a temeprature humidity test chamber, they will find a very common problem. Why is the price of the same equipment quoted by the two manufacturers very different? 1, the chamber body process,which effects the exterior case quality,this price has a gap. 2, the components, esp.components of the refrigeration system, is the core value of the temperature humidity test chamber. 3, even if the body and refrigeration components are the same, some prices are different, that is the manufacturer technical level. 4, regional issues, Wuxi,Changzhou, Dongguan, these brands need to know more. 5. after-sales, a powerful manufacturer often with a sound after-sales service dept.. The above are both technical and service, as well as the delivery cost of goods to the local and overseas are different.

Symor Instrument Equipment Co.,Ltd

Board-Level Thermal Cycling and Drop-Test Reliability of Large, Ultrathin Glass BGA Packages for Smart Mobile Applications

Technical Library | 2018-08-22 14:05:42.0

Glass substrates are emerging as a key alternative to silicon and conventional organic substrates for high-density and high-performance systems due to their outstanding dimensional stability, enabling sub-5-µm lithographic design rules, excellent electrical performance, and unique mechanical properties, key in achieving board-level reliability at body sizes larger than 15 × 15 mm2. This paper describes the first demonstration of the board-level reliability of such large, ultrathin glass ball grid array (BGA) packages directly mounted onto a system board, considering both their thermal cycling and drop-test performances.

Institute of Electrical and Electronics Engineers (IEEE)

Body of Knowledge (BOK) for Leadless Quad Flat No-Lead/Bottom Termination Components (QFN/BTC) Package Trends and Reliability

Technical Library | 2023-09-18 14:10:01.0

As with many advancements in the electronics industry, consumer electronics is driving the trends for electronic packaging technologies toward reducing size and increasing functionality. Microelectronics meeting the technology needs for higher performance, reduced power consumption and size, and off the- shelf availability. Due to the breadth of work being performed in the area of microelectronics packaging/components, this report limits it presentation to board design, manufacturing, and processing parameters on assembly reliability for leadless (e.g., quad flat no-lead (QFN) or a generic term of bottom termination component (BTC)) packages. This style of package was selected for investigation because of its significant growth, lower cost, and improved functionality, especially for use in an RF application.

NASA Office Of Safety And Mission Assurance

Using Automated 3D X-Ray Inspection to Detect BTC Defects

Technical Library | 2013-07-25 14:02:15.0

Bottom-termination components (BTC), such as QFNs, are becoming more common in PCB assemblies. These components are characterized by hidden solder joints. How are defects on hidden DFN joints detected? Certainly, insufficient solder joints on BTCs cannot be detected by manual visual inspection. Nor can this type of defect be detected by automated optical inspection; the joint is hidden by the component body. Defects such as insufficients are often referred to as "marginal" defects because there is likely enough solder present to make contact between the termination on the bottom-side of the component and the board pad for the component to pass in-circuit and functional test. Should the board be subjected to shock or vibration, however, there is a good chance this solder connection will fracture, leading to an open connection.

Flex (Flextronics International)

Reliable Young's Modulus Value of High Flexible, Treated Rolled Copper Foils Measured by Resonance Method

Technical Library | 2018-08-15 17:27:28.0

Smartphones and tablets require very high flexibility and severe bending performance ability of the flexible printed circuits (FPCs) to fit into their thinner and smaller body designs. In these FPCs, the extraordinary highly flexible, treated rolled-annealed (RA) copper foils have recently used instead of regular RA foil and electro deposited foils. It is very important to measure the Young's moduli of these foils predicting the mechanical properties of FPCs such as capabilities of fatigue endurance, folding, and so on. Even though the manufacturers use IPC TM-650 2.4.18.3 test method for measuring Young's modulus of copper foils over many years, where Young's modulus is calculated from the stress–strain (S–S) curve, it is quite difficult to obtain the accurate Young's modulus of metal foils by this test method.

JX Nippon Mining & Metals

New Requirements for SIR Measurement

Technical Library | 2015-02-27 16:46:30.0

During the last period of newly assembled electrical devices (pcbs), new component types like LGA and QFN were also qualified as well as smaller passive components with reliability requirements based on the automotive and industrial industry. In the narrow gaps under components, residues can accumulate more by the capillary forces. This is not that much a surface resistance than an interface issue. Also that the flux residues under such types of components creates interaction with the solder resists from the pcb, as well as the component body was not completely described in the standard SIR measurement. On the other hand also, electrical influence with higher voltage creates new terms and conditions, in particular the combination of power and logic in such devices. The standard SIR measurement cannot analyze those combinations.The paper will discuss the requirements for a measurement process, and will give results. The influences of the pcb and component quality will also be discussed. Furthermore it will describe requirements for nc solder paste to increase the chemical/thermical/electrical reliability for whole devices

Heraeus

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