Technical Library | 2023-01-17 17:58:36.0
Heterogeneous integration has become an important performance enabler as high-performance computing (HPC) demands continue to rise. The focus to enable heterogeneous integration scaling is to push interconnect density limit with increased bandwidth and improved power efficiency. Many different advanced packaging architectures have been deployed to increase I/O wire / area density for higher data bandwidth requirements, and to enable more effective die disaggregation. Embedded Multi-die Interconnect Bridge (EMIB) technology is an advanced, cost-effective approach to in-package high density interconnect of heterogeneous chips, providing high density I/O, and controlled electrical interconnect paths between multiple dice in a package. In emerging architectures, it is required to scale down the EMIB die bump pitch in order to further increase the die-to-die (D2D) communication bandwidth. Aa a result, bump pitch scaling poses significant challenges in the plated solder bump reflow process, e.g., bump height / coplanarity control, solder wicking control, and bump void control. It's crucial to ensure a high-quality solder bump reflow process to meet the final product reliability requirements. In this paper, a combined formic acid based fluxless and vacuum assisted reflow process is developed for fine pitch plated solder bumping application. A high-volume production (HVM) ready tool has been developed for this process.
Technical Library | 2023-12-27 12:27:29.0
Background Of SMT Auto IC Programming Machines In the dynamic landscape of electronics manufacturing, SMT Auto IC Programming Machines, also known as IC Programmers, have become indispensable tools. These machines play a crucial role in the semiconductor industry, addressing the escalating demand for efficient programming tools as electronic devices become more intricate. Specifically designed to load firmware or programs onto integrated circuits (ICs), these machines ensure the functionality of ICs and facilitate their seamless integration into various electronic applications. Significance Of SMT Auto IC Programming Machines The significance of SMT Auto IC Programming Machines lies in their ability to streamline the manufacturing process of electronic devices. ICs, ranging from microcontrollers to memory chips, serve as the central processing units in electronic systems. IC Programming Machines enable the customization of these ICs, allowing manufacturers to program specific functionalities, update firmware, and adapt to diverse applications. Furthermore, these machines contribute significantly to the rapid development of new products. In a market where time-to-market is critical, IC Programming Machines provide the flexibility to quickly program different ICs, reducing production lead times and enhancing overall efficiency. Operational Principles Of IC Programming Machines Hardware Architecture SMT Auto IC Programming Machines consist of a sophisticated hardware architecture comprising a controller, socket, pin detection system, and additional peripherals. The controller acts as the brain, orchestrating the programming process, while the socket provides a connection interface for the IC. Programming Algorithms At the core of IC Programming Machines are various programming algorithms encompassing essential operations such as erasure, writing, and verification. The choice of algorithms depends on the specific requirements of the IC and the desired functionality. Communication Protocols Effective communication between the IC Programming Machine and the target IC is facilitated by standardized communication protocols such as JTAG, SPI, and I2C. The selection of a particular protocol is influenced by factors such as data transfer speed, complexity, and compatibility with the IC. Advanced Features And Characteristics Equipped with advanced features like parallel programming, support for multiple ICs, and online programming, IC Programming Machines elevate their capabilities, enhancing production efficiency and flexibility. Practical Applications IC Programming Machines find practical applications across various industries, from automotive electronics to consumer electronics. Case studies illustrate how these machines contribute to improved production workflows and product quality by ensuring programmed ICs meet specific application requirements. Future Trends Looking ahead, the future of SMT Auto IC Programming Machines holds exciting prospects. Anticipated trends include advancements in programming speed, support for emerging communication protocols, and increased integration with smart manufacturing systems. These developments aim to address the evolving demands of the electronics industry. I.C.T-910 Programming Machine Invest in the I.C.T-910 for an efficient and reliable IC programming experience. The I.C.T-910 complies with European safety standards, holding a CE certificate that attests to its quality and adherence to safety regulations. Our skilled engineers at I.C.T are committed to ensuring your success by providing professional training and assistance with equipment installation. I.C.T: Your Comprehensive SMT Equipment Provider I.C.T stands as a comprehensive SMT equipment provider, offering end-to-end solutions for your SMT production line needs. Tailoring services to your specific requirements and product specifications, we conduct a thorough analysis to determine the precise SMT equipment that suits your needs. Our commitment is to deliver the highest quality and cost-effective solutions, ensuring optimal performance and efficiency for your production processes. Partner with I.C.T for a customized approach to SMT equipment that aligns perfectly with your manufacturing goals. Contact us for an inquiry today.
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
Technical Library | 2018-01-17 22:47:02.0
Fine pitch copper (Cu) Pillar bump has been growing adoption in high performance and low-cost flip chip packages. Higher input/output (I/O) density and very fine pitch requirements are driving very small feature sizes such as small bump on a narrow pad or bond-on-lead (BOL) interconnection, while higher performance requirements are driving increased current densities, thus assembling such packages using a standard mass reflow (MR) process and maintaining its performance is a real and serious challenge. (...) In this study a comprehensive finding on the assembly challenges, package design, and reliability data will be published. Originally published in the SMTA International 2016
Technical Library | 2019-07-30 15:29:50.0
Area Array microelectronic packages with small pitch and large I/O counts are now widely used in microelectronics packaging. The impact of various package design and materials/process parameters on reliability has been studied through extensive literature review. Reliability of Ceramic Column Grid Array (CCGA) package assemblies has been evaluated using JPL thermal cycle test results (-50°/75°C, -55°/100°C, and -55°/125°C), as well as those reported by other investigators. A sensitivity analysis has been performed using the literature data to study the impact of design parameters and global/local stress conditions on assembly reliability. The applicability of various life-prediction models for CCGA design has been investigated by comparing model's predictions with the experimental thermal cycling data. Finite Element Method (FEM) analysis has been conducted to assess the state of the stress/strain in CCGA assembly under different thermal cycling, and to explain the different failure modes and locations observed in JPL test assemblies.
Technical Library | 2013-03-14 17:19:28.0
Commercial-off-the-shelf ball/column grid array packaging (COTS BGA/CGA) technologies in high reliability versions are now being considered for use in a number of National Aeronautics and Space Administration (NASA) electronic systems. Understanding the process and quality assurance (QA) indicators for reliability are important for low-risk insertion of these advanced electronic packages. This talk briefly discusses an overview of packaging trends for area array packages from wire bond to flip-chip ball grid array (FCBGA) as well as column grid array (CGA). It then presents test data including manufacturing and assembly board-level reliability for FCBGA packages with 1704 I/Os and 1-mm pitch, fine pitch BGA (FPBGA) with 432 I/Os and 0.4-mm pitch, and PBGA with 676 I/Os and 1.0-mm pitch packages. First published in the 2012 IPC APEX EXPO technical conference proceedings.
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