Technical Library: dek improvement projects (Page 1 of 1)

Thermal Interface Material (TIM) Dispensing For Consumer Products

Technical Library | 2023-08-16 18:25:16.0

In one of our Consumer Electronics projects, a leader of networking technologies requested to test dispensing performance of a thermally conductive material, Fujipoly Sarcon SPG-50A. This material improves heat dissipation for higher frequency applications and reduces the negative effects of thermal resistance under heat, cold, humid, and thermal shock conditions. The customer's goal was to dispense a 1mm diameter dot with acceptable speed and consistency.

GPD Global

Case study: Improving PCBA Yield

Technical Library | 2010-04-22 09:11:54.0

Current situation: Present Rejection = 18%. Sigma Level = 2.42 Scope of Project: Vendor PCB Assembly to Functional Testing of PCBA

Larsen Toubro Medical Equipment & Systems Ltd

Improve Assembly Turnaround For Tab-Routed Array Panelization

Technical Library | 2017-05-31 18:19:44.0

These guidelines give the assembly team a standardized, no-nonsense method to produce a reliable panelization solution. By eliminating panelization guesswork, you ensure successful assembly even for complex projects.

Power Design Services

What Type of PCB Substrate Material Is Right for Your PCB?

Technical Library | 2017-01-24 02:15:49.0

Basic performance of PCB (Printed Circuit Board) depends on the performance of substrate material. In order to improve the performance of PCB, you have to increase the performance of PCB substrate material first. This article introduces how to chose PCB substrate material for your custom PCB project from multiple perspectives.

PCBCart

SMT Line Improvements for High Mix, Low Volume Electronics Manufacturing

Technical Library | 2011-08-04 19:29:53.0

This work covers two major projects aimed at increasing quality and efficiency on a high mix, low volume surface mount electronics production line. Specifically the installation of a ten zone reflow oven and an enhanced changeover method for SMT pick and

Auburn University

Solar Panel Design Decision and General Information Sheet

Technical Library | 2014-04-10 18:04:04.0

This paper is meant to be a guide and a reference to new and old members alike who wish to know about, understand, and improve on the decisions made and processes implemented to build the current solar panels. The following paragraphs in the introduction will lay out background information on solar panels and cube satellites. This entire document was written with the idea that the reader will be able to follow the decisions made to construct the solar panels and then with this knowledge find areas of the project for improvement.

iSAT Group

EUV Lithography -The Successor to Optical Lithography?

Technical Library | 1999-05-07 08:53:21.0

This paper discusses the basic concepts and current state of development of EUV lithography (EUVL), a relatively new form of lithography that uses extreme ultraviolet (EUV) radiation with a wavelength in the range of 10 to 14 nanometer (nm) to carry out projection imaging. Currently, and for the last several decades, optical projection lithography has been the lithographic technique used in the high-volume manufacture of integrated circuits. It is widely anticipated that improvements in this technology will allow it to remain the semiconductor industry's workhorse through the 100 nm generation of devices. However, some time around the year 2005, so-called Next-Generation Lithographies will be required.

Intel Corporation

Improvement of Organic Packaging Thermal Cycle Performance Measurement

Technical Library | 2006-11-01 22:37:23.0

Flip Chip Plastic Ball Grid Array (FCPBGA) modules, when subjected to extreme environmental stress testing, may often reveal mechanical and electrical failure mechanisms which may not project to the field application environment. One such test can be the Deep Thermal Cycle (DTC) environmental stress which cycles from -55°C to 125°C. This “hammer” test provides the customer with a level of security for robustness, but does not typically represent conditions which a module is likely to experience during normal handling and operation.

IBM Corporation

DoD/EPA/DOE SERDP WP-2213: Novel Whisker Mitigating Composite Conformal Coat Assessment

Technical Library | 2023-02-13 19:14:03.0

Technology Focus: Develop and evaluate nanoparticle filled conformal coatings designed to provide long term whisker penetration resistance and coverage on tin rich metal surfaces prone to whisker growth in commercial lead-free electronics used in modern DoD systems. Research Objectives: Identify the fundamental mechanisms by which conformal coatings provide long-term tin whisker penetration resistance and inhibit nucleation/growth. Correlate mechanical properties and coverage thickness to whisker penetration resistance. Project Progress and Results: Functionalized nanosilica and non-functional nanoalumina enhanced polyurethane conformal coatings have shown improved spray coating coverage characteristics and crack resistance during thermal cycling fatigue testing. Lead-free assembly whisker mitigation validation testing is in process. Technology Transition: Current project partners provide coating materials to industry. SERDP test data will be considered during updates to the DoD adopted IPC standards for coating materials and coverage.

BAE SYSTEMS

Reliability Screening of Lower Melting Point Pb-Free Alloys Containing Bi

Technical Library | 2015-07-01 16:51:43.0

Aerospace and military companies continue to exercise RoHS exemptions and to intensively research the long term attachment reliability of RoHS compliant solders. Their products require higher vibration, drop/shock performance, and combined-environment reliability than the conventional SAC305 alloy provides. The NASA-DoD Lead-Free Electronics Project confirmed that pad cratering is one of the dominant failure modes that occur in various board level reliability tests, especially under dynamic loading. One possible route to improvement of the mechanical and thermo-mechanical properties of solder joints is the use of Pb-free solders with lower process temperatures. Lower temperatures help reduce the possibility of damaging the boards and components, and also may allow for the use of lower Tg board materials which are less prone to pad cratering defects. There are several Sn-Ag-Bi and Sn-Ag-Cu-Bi alloys which melt about 10°C lower than SAC305. The bismuth in these solder compositions not only reduces the melting temperature, but also improves thermo-mechanical behavior. An additional benefit of using Bi-containing solder alloys is the possibility to reduce the propensity to whisker growth

Honeywell International

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