Technical Library: electro (Page 1 of 1)

Novel Probing Concepts for Mass-Production Tests: Design and Challenges

Technical Library | 2012-06-15 00:43:47.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro

INGUN Pruefmittelbau GmbH

Guidelines for the Long-Term Storage of Components, Subasseemblies and Devuces

Technical Library | 2024-06-19 14:23:36.0

These guidelines on long-term storage are intended to help develop a supply strategy for components which need to be warehoused, processed and used beyond ...

ZVEI - German Electro and Digital Industry Association

Reliable Young's Modulus Value of High Flexible, Treated Rolled Copper Foils Measured by Resonance Method

Technical Library | 2018-08-15 17:27:28.0

Smartphones and tablets require very high flexibility and severe bending performance ability of the flexible printed circuits (FPCs) to fit into their thinner and smaller body designs. In these FPCs, the extraordinary highly flexible, treated rolled-annealed (RA) copper foils have recently used instead of regular RA foil and electro deposited foils. It is very important to measure the Young's moduli of these foils predicting the mechanical properties of FPCs such as capabilities of fatigue endurance, folding, and so on. Even though the manufacturers use IPC TM-650 2.4.18.3 test method for measuring Young's modulus of copper foils over many years, where Young's modulus is calculated from the stress–strain (S–S) curve, it is quite difficult to obtain the accurate Young's modulus of metal foils by this test method.

JX Nippon Mining & Metals

Nanoelectromechanical Switches for Low-Power Digital Computing

Technical Library | 2017-03-02 18:13:05.0

The need for more energy-efficient solid-state switches beyond complementary metal-oxide-semiconductor (CMOS) transistors has become a major concern as the power consumption of electronic integrated circuits (ICs) steadily increases with technology scaling. Nano-Electro-Mechanical (NEM) relays control current flow by nanometer-scale motion to make or break physical contact between electrodes, and offer advantages over transistors for low-power digital logic applications: virtually zero leakage current for negligible static power consumption; the ability to operate with very small voltage signals for low dynamic power consumption; and robustness against harsh environments such as extreme temperatures. Therefore, NEM logic switches (relays) have been investigated by several research groups during the past decade. Circuit simulations calibrated to experimental data indicate that scaled relay technology can overcome the energy-efficiency limit of CMOS technology. This paper reviews recent progress toward this goal, providing an overview of the different relay designs and experimental results achieved by various research groups, as well as of relay-based IC design principles. Remaining challenges for realizing the promise of nano-mechanical computing, and ongoing efforts to address these, are discussed.

EECS at University of California

Ingress Protection (IP) test for electronic enclosure test

Technical Library | 2019-04-07 23:34:10.0

Ingress Protection Test Chamber is used to determine the protection degree of product enclosures,the protection level provided by the enclosure is called IP code,our IP test chamber compeletely follow the standard IEC60529 and others. IP protection grade is an important index of electrical equipment safety protection. Protective-grade systems such as ip, which provide a method of classifying products in terms of dust-proof, waterproof and anti-collision levels of electrical equipment and packaging, which have been recognized by most European countries, as drafted by the International Electrotechnical Association (iec (international electro technical commission). And announced in ied529 (bs en 60529 / 1992) outer packing protection grade (ip code). The level of protection is expressed in terms of IP followed by two numbers, which are used to define the level of protection. The first number indicates the extent of the equipment‘s resistance to dust, or the degree to which people are protected from harm in sealed environments. I represents a level that prevents solid foreign matter from entering, with a maximum level of 6; The second number indicates the extent to which the equipment is waterproof. P represents the level of protection against influent and the highest level is 8. Such as the protection level of the motor ip65. Contact electrical equipment protection and external material protection level (first digit) Electrical equipment waterproof protection level (second digit) . IP is the international code used to identify the protection grade ip grade consists of two numbers, the first number for dust, and the second number for waterproof, the larger the number means the better protection level.

Symor Instrument Equipment Co.,Ltd

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