Technical Library: ems 2 (Page 1 of 1)

Electromigration Damage Mechanics of Lead-Free Solder Joints Under Pulsed DC: A Computational Model

Technical Library | 2013-06-13 15:31:24.0

Electromigration (EM) is a mass transportation mechanism driven by electron wind force, thermal gradient, chemical potential and stress gradient. According to Moore’s law, number of transistors on integrated circuits (ICs) doubles approximately every 2 years. Moore’s law holds true since its introduction in 1970s. This insatiable demand for smaller ICs size, larger integration and higher Input/Output (IO) count of microelectronics has made ball grid array (BGA) the most promising connection type in electronic packaging industry. This trend, however, renders EM reliability of solders joints a major bottleneck to hinder further development of electronics industry...

Electronic Packaging Laboratory, State University of New York

  1  

ems 2 searches for Companies, Equipment, Machines, Suppliers & Information

PCB Handling Machine with CE

Have you found a solution to REDUCE DISPENSE REWORK? Your answer is here.
Fluid Dispensing Aerospace

Software for SMT placement & AOI - Free Download.
Voidless Reflow Soldering

Software programs for SMT placement and AOI Inspection machines from CAD or Gerber.
Win Source Online Electronic parts

Training online, at your facility, or at one of our worldwide training centers"