Technical Library | 2012-09-06 18:19:37.0
First published in the 2012 IPC APEX EXPO technical conference proceedings. Pad Cratering opens circuits. This occurs when the resin crack (fracture) migrates through a copper trace or via. This happens at assembly, in service or during handling. When com
Technical Library | 2012-09-20 21:45:38.0
First published in the 2012 IPC APEX EXPO technical conference proceedings. An evaluation of four FR4 laminates in commonly used stack-ups was done to determine their survivability for the Pb-free HASL process followed by a worst case Pb-free manufacturin
Technical Library | 2012-09-27 19:50:01.0
First published in the 2012 IPC APEX EXPO technical conference proceedings. Over the past few years a new family of laminate systems has been developed to face the increasing physical demands of withstanding Pb-free soldering processes used in the assembl
Technical Library | 2012-12-06 17:36:37.0
Inspection of integrated power electronics equals sophisticated test task. X-ray inspection based on 2D / 2.5D principles not utilizable. Full 3D inspection with adapted image capturing and reconstruction is necessary for test task.... First published in the 2012 IPC APEX EXPO technical conference proceedings.
Technical Library | 2013-05-02 12:45:25.0
Summary of some new and existing technologies for printed electronics outside of traditional membrane switch manufacturing. Discussion of requirements for understanding the technology of these applications in order to capitalize on them... First published in the 2012 IPC APEX EXPO technical conference proceedings.
Technical Library | 2019-08-24 09:02:25.0
Many customers looking for IC shipping tubes value the appearance of the packing tube. They will feel that if the appearance of the IC tube does not look good, the quality will not be very good, so the first impression of the appearance of the Antistatic ic tube is very important. So what are the factors that affect the appearance of IC tubes?
Technical Library | 2012-05-23 14:16:41.0
first published in the 2012 IPC APEX EXPO technical conference proceedings. BIST (build-in self test ) is the technique of designing additional hardware and software features into integrated circuits to allow them to perform self-testing, i.e., testing of
Technical Library | 2012-06-21 23:06:06.0
First published in the 2012 IPC APEX EXPO technical conference proceedings. Most high reliability electronic equipment producers continue to manufacture and support tin-lead (SnPb) electronic products despite the increasing trend for design and conversion
Technical Library | 2012-06-27 18:26:34.0
First published in the 2012 IPC APEX EXPO technical conference proceedings. Signal integrity analysis has shown that printed circuit board (PCB) insertion loss is a key factor affecting high speed channel performance. Determining and controlling PCB inser
Technical Library | 2012-10-04 18:52:43.0
First published in the 2012 IPC APEX EXPO technical conference proceedings... Due to the obsolescence of SnPb BGA components, electronics manufacturers that use SnPb solder paste either have to use lead-free BGAs and adjust the reflow process or re-ball t
