Technical Library: handle (Page 2 of 5)

Pad Cratering - The Invisible Threat to the Electronics Industry

Technical Library | 2012-09-06 18:19:37.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. Pad Cratering opens circuits. This occurs when the resin crack (fracture) migrates through a copper trace or via. This happens at assembly, in service or during handling. When com

Integral Technology, Inc

Interconnect Reliability Correlation with System Design and Transportation Stress

Technical Library | 2020-10-18 19:35:05.0

Interconnect reliability especially in BGA solder joints and compliant pins are subjected to design parameters which are very critical to ensure product performance at pre-defined shipping condition and user environment. Plating thickness of compliant pin and damping mechanism of electronic system design are key successful factors for this purpose. In additional transportation and material handling process of a computer server system will be affected by shock under certain conditions. Many accessories devices in the server computer system tend to become loose resulting in poor contact or solder intermittent interconnect problems due to the shock load from the transportation and material handling processes.

MiTAC International Corporation

Handling of Highly-Moisture Sensitive Components - An Analysis of Low-Humidity Containment and Baking Schedules

Technical Library | 2022-09-12 14:07:47.0

Unique component handling issues can arise when an assembly factory uses highly-moisture sensitive surface mount devices (SMDs). This work describes how the distribution of moisture within the molded plastic body of a SMD is an important variable for survivability. JEDEC/IPC [1] moisture level rated packages classified as Levels 4-5a are shown to require additional handling constraints beyond the typical out-of-bag exposure time tracking. Nitrogen or desiccated cabinet containment is shown as a safe and effective means for long-term storage provided the effects of prior out-of-bag exposure conditions are taken into account. Moisture diffusion analyses coupled with experimental verification studies show that time in storage is as important a variable as floor-life exposure for highly-moisture sensitive devices. Improvements in floor-life survivability can be obtained by a handling procedure that includes cyclic storage in low humidity containment. SMDs that have exceeded their floor-life limits are analyzed for proper baking schedules. Optimized baking schedules can be adopted depending on a knowledge of the exposure conditions and the moisture sensitivity level of the device.

Alcatel-Lucent

Soldering And Handling Recommendations For Large Size MLC Capacitors

Technical Library | 2011-04-14 15:29:39.0

Multilayer Ceramic Capacitors (MLCC) come in a broad range of sizes, geometries, and values, offering design engineers with many options for designing circuits. In many cases these MLCC’s offer advantages over other types of capacitors including low ESR/E

HolyStone International

Improvement of Organic Packaging Thermal Cycle Performance Measurement

Technical Library | 2006-11-01 22:37:23.0

Flip Chip Plastic Ball Grid Array (FCPBGA) modules, when subjected to extreme environmental stress testing, may often reveal mechanical and electrical failure mechanisms which may not project to the field application environment. One such test can be the Deep Thermal Cycle (DTC) environmental stress which cycles from -55°C to 125°C. This “hammer” test provides the customer with a level of security for robustness, but does not typically represent conditions which a module is likely to experience during normal handling and operation.

IBM Corporation

Electrical Performance of an Organic, Z-interconnect, Flip-Chip Substrate

Technical Library | 2007-10-25 18:39:07.0

More and more substrate designs require signals paths that can handle multi-gigahertz frequencies [1-3]. The challenges for organic substrates, in meeting these electrical requirements, include using high-speed, low-loss materials, manufacturing precise structures and making a reliable finished product. A new substrate technology is presented that addresses these challenges.

i3 Electronics

Startling Results From Reliability Testing

Technical Library | 2009-03-13 00:27:09.0

Open product reliability testing in Stockholm, Sweden in January as part of a live production event generated some quite startling results. It was apparent that many components simply cannot handle the high reflow temperatures of a lead-free soldering process, and that many surface-mount machine suppliers are battling significant problems with QFN packages and other components that are mounting edgeways (bill boarding). However, some suppliers have achieved good results.

Mycronic AB

Adhesive Bonding Instead Of Welding Or Bolting

Technical Library | 2019-05-01 10:07:37.0

Adhesive bonding involves the use of adhesive to form a material bond between two or more assembly parts. In addition to regular adhesive bonding applications, hybrid processes, in which the adhesive bond includes another function such as sealing or heat dissipation, are gaining importance. Traditional joining methods such as welding or bolting are progressively being replaced in industrial applications by efficient adhesive bonding processes, since these processes provide a number of advantages such as part weight reduction or simplified parts handling.

Scheugenpflug Inc.

Coordinating Hundreds of Cooperative, Autonomous Vehicles in Warehouses

Technical Library | 2022-01-12 19:17:37.0

Occasionally, mature industries are turned upside down by innovations. The years of research on robotics and multiagent systems are coming together to provide just such a disruption to the material-handling industry. While autonomous guided vehicles (AGVs) have been used to move material within warehouses since the 1950s, they have been used primarily to transport very large, very heavy objects like rolls of uncut paper or engine blocks.

Association for the Advancement of Artificial Intelligence

Understanding Creep Corrosion Field Fails

Technical Library | 2022-03-16 19:48:18.0

Dendrites, Electrochemical Migration (ECM) and parasitic leakage, are usually caused by process related contamination. For example, excess flux, poor handling, extraneous solder, fibers, to name a few. One does not normally relate these fails with environmental causes. However, creep corrosion is a mechanism by which electronic products fail in application, primarily related to sulfur pollution present in the air.1 The sulfur reacts with exposed silver, and to a lesser extent, exposed copper. This paper will explore various aspects of the creep corrosion chemical reaction

Foresite Inc.


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