Technical Library: in circuit testing (Page 2 of 17)

BGA Thermal Shock Testing

Technical Library | 2007-02-01 09:27:47.0

The purpose of the testing was to compare the resistance and check for open circuit conditions of reworked BGA test samples made with and without StencilQuik™ after 500 thermal shock cycles. StencilQuick™ is a product of Best Inc. In this series of tests, the resistance of daisy chain resistance patterns running between the BGA and test board after exposure to thermal shock was measured.

BEST Inc.

Latent short circuit failure in high-rel PCBs caused by lack of cleanliness of PCB processes and base materials

Technical Library | 2021-03-10 23:57:29.0

Latent short circuit failures have been observed during testing of Printed Circuit Boards (PCB) for power distribution of spacecraft of the European Space Agency. Root cause analysis indicates that foreign fibers may have contaminated the PCB laminate. These fibers can provide a pathway for electromigration if they bridge the clearance between nets of different potential in the presence of humidity attracted by the hygroscopic laminate resin. PCB manufacturers report poor yield caused by contamination embedded in laminate. Inspections show ...

European Space Agency

Overcoming Logistic, Economic and Technical Challenges to Implementing Functional Test in High Mix / High Volume Production Environments

Technical Library | 2012-11-29 14:23:58.0

1000 units per day) production environment presents challenging technical, logistic and cost obstacles that are usually more complex than those encountered at the inspection (automated optical inspection) and the manufacturing process test step (in-circuit test).

SiFO Technologies

Why Design PCB Assemblies with Testing in Mind?

Technical Library | 2017-11-14 15:30:04.0

Can you put a product that hasn't been fully tested on the market? When it comes to Printed Circuit Board (PCB) assembly and manufacturing, most firms’ answer is neither a strict yes or no.

Power Design Services

Design for Testability (DFT) to Overcome Functional Board Test Complexities in Manufacturing Test

Technical Library | 2018-06-20 13:11:57.0

Manufacturers test to ensure that the product is built correctly. Shorts, opens, wrong or incorrectly inserted components, even catastrophically faulty components need to be flagged, found and repaired. When all such faults are removed, however, functional faults may still exist at normal operating speed, or even at lower speeds. Functional board test (FBT) is still required, a process that still relies on test engineers’ understanding of circuit functionality and manually developed test procedures. While functional automatic test equipment (ATE) has been reduced considerably in price, FBT test costs have not been arrested. In fact, FBT is a huge undertaking that can take several weeks or months of test engineering development, unacceptably stretching time to market. The alternative, of selling products that have not undergone comprehensive FBT is equally, if not more, intolerable.

A.T.E. Solutions, Inc.

Design for Testability (DFT) to Overcome Functional Board Test Complexities in Manufacturing Test

Technical Library | 2021-05-20 13:45:49.0

Manufacturers test to ensure that the product is built correctly. Shorts, opens, wrong or incorrectly inserted components, even catastrophically faulty components need to be flagged, found and repaired. When all such faults are removed, however, functional faults may still exist at normal operating speed, or even at lower speeds. Functional board test (FBT) is still required, a process that still relies on test engineers' understanding of circuit functionality and manually developed test procedures. While functional automatic test equipment (ATE) has been reduced considerably in price, FBT test costs have not been arrested. In fact, FBT is a huge undertaking that can take several weeks or months of test engineering development, unacceptably stretching time to market. The alternative, of selling products that have not undergone comprehensive FBT is equally, if not more, intolerable.

A.T.E. Solutions, Inc.

Using JTAG Emulation for Board-Level Functional Test Demanding Test

Technical Library | 2010-09-02 13:13:03.0

As chip packaging and interconnectivity have become more dense and operate at higher clock frequencies, physical access for traditional bed-of-nails testing becomes limited. This results in loss of ICT (in-circuit test) fault coverage and higher test fi

Corelis Inc

Design Guidelines For In-Circuit Testability

Technical Library | 2021-03-24 01:26:05.0

In-circuit test (ICT) has remained one of the most popular and cost-effective test methods for medium and high volume printed circuit board assembly (PCBA) for many years. This is due to its component-level fault diagnosis capability- and its speed.

JJS Manufacturing

Cracking Problems in Low-Voltage Chip Ceramic Capacitors

Technical Library | 2022-09-25 20:03:37.0

Cracking remains the major reason of failures in multilayer ceramic capacitors (MLCCs) used in space electronics. Due to a tight quality control of space-grade components, the probability that as manufactured capacitors have cracks is relatively low, and cracking is often occurs during assembly, handling and the following testing of the systems. Majority of capacitors with cracks are revealed during the integration and testing period, but although extremely rarely, defective parts remain undetected and result in failures during the mission. Manual soldering and rework that are often used during low volume production of circuit boards for space aggravate this situation. Although failures of MLCCs are often attributed to the post-manufacturing stresses, in many cases they are due to a combination of certain deviations in the manufacturing processes that result in hidden defects in the parts and excessive stresses during assembly and use. This report gives an overview of design, manufacturing and testing processes of MLCCs focusing on elements related to cracking problems. The existing and new screening and qualification procedures and techniques are briefly described and assessed by their effectiveness in revealing cracks. The capability of different test methods to simulate stresses resulting in cracking, mechanisms of failures in capacitors with cracks, and possible methods of selecting capacitors the most robust to manual soldering stresses are discussed.

NASA Office Of Safety And Mission Assurance

Process Control of Ionic Contamination Achieving 6-Sigma Criteria in The Assembly of Electronic Circuits

Technical Library | 2018-11-29 13:43:54.0

Ionic contamination testing as a process control tool a newly developed testing protocol based on IPC-TM 650 2.3.25, was established to enable monitoring of ionic contamination within series production. The testing procedure was successfully implemented within the production of high reliability, safety critical electronic circuits, involving multiple production sites around the world. I will be shown in this paper that the test protocol is capable for meeting Six-Sigma-Criteria.

Robert Bosch LLC Automotive Electronics Division


in circuit testing searches for Companies, Equipment, Machines, Suppliers & Information

Midwest Circuit Technology
Midwest Circuit Technology

Midwest Circuit Technology provides Carbide Router Bits and End Milling Cuters for use in PCB Depaneling equipment. We have over 35 years of supplying tools and machining experience in drilling, Routing, Test Fixture manufacture.

Manufacturer / Distributor

114 Barrington Town Square
Aurora, OH USA

Phone: 13309956900

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