Technical Library: measuring (Page 8 of 13)

With Koh Young, Matric Group Delivers Breakthrough Operational Improvements

Technical Library | 2023-10-19 22:03:14.0

Koh Young Technology, the industry leader in True 3D measurement-based inspection solutions, proudly releases another customer success story with Matric Group. This case study shows how Matric Group has leveraged their partnership with Koh Young to be one of the first in the industry to use pre-reflow AOI as a game-changer for line efficiency and improved yield. All while creating a central inspection war room to allow just one person to manage all inline inspection, increasing automation, and control and mitigating talent shortages.

Koh Young America, Inc.

Achieving Tight Tolerances

Technical Library | 2024-05-31 19:29:15.0

A tight tolerance machine isn't necessarily a specific machine type. Rather, it's any machine capable of producing parts with precision tolerances. This means minimal variation in the final dimensions of the part. These cutting-edge tools are meticulously engineered to achieve exceptionally precise measurements within minuscule margins. This is accomplished with CNC, or computer numerical control, a manufacturing method that automates the movement of a machine and optimizes for precision. With technology and advanced techniques, these machines ensure that every component meets exact specifications, guaranteeing unparalleled accuracy in manufacturing processes.

A-Laser, Inc.

Strength of Lead-free BGA Spheres in High Speed Loading

Technical Library | 2008-04-08 17:42:27.0

Concern about the failure of lead-free BGA packages when portable devices such as cell phones are accidentally dropped and a general concern about the resistance of these packages under shock loading has prompted an interest in the impact strength of the soldered BGA connection. This paper reports the results of the measurement of the impact strength of lead-free 0.5±0.01mm diameter BGA spheres on 0.42mm solder mask defined pads on copper/OSP and ENIG substrates using recently developed equipment that can load individual BGA spheres at high strain rates in shear and tension.

Nihon Superior Co., Ltd.

Effect Of Squeegee Blade On Solder Paste Print Quality

Technical Library | 2010-06-17 20:48:04.0

The solder paste deposition process is viewed by many in the industry as the leading contributor of defects in the Surface Mount Technology (SMT) assembly process. As with all manufacturing processes, solder paste printing is subject to both special and common cause variation. Just like using graduated cylinders from distinctly different manufacturing processes to measure a volume of liquid, using different blades types can contribute significant special cause variation to a process. Understanding the significant differences in print performance between blade types is an important first step to establishing a standard blade for an SMT process.

Speedline Technologies, Inc.

Microspring Characterization and Flip-Chip Assembly Reliability

Technical Library | 2014-05-29 13:48:14.0

Electronics packaging based on stress-engineered spring interconnects has the potential to enable integrated IC testing, fine pitch, and compliance not readily available with other technologies. We describe new spring contacts which simultaneously achieve low resistance ( 30 μm) in dense 2-D arrays (180 ~ 180-µm pitch). Mechanical characterization shows that individual springs operate at approximately 150-µN force. Electrical measurements and simulations imply that the interface contact resistance contribution to a single contact resistance is This paper suggests that integrated testing and packaging can be performed with the springs, enabling new capabilities for markets such as multichip modules.

Institute of Electrical and Electronics Engineers (IEEE)

Implementing Warpage Management: A Five-Step Process for EMS Providers

Technical Library | 2014-08-19 16:07:15.0

Warpage management consists of planning, measuring, analyzing, sharing, and reacting to data related to the surface shapes of electronics components as they change throughout the reflow assembly process. Leading semiconductor manufacturers have had warpage management systems in place for ten years or more, mainly because microchip package warpage must be understood and compensated for in order to attain high assembly yields. Similarly, newer device architectures such as package-on-package and system-on-a-chip are sensitive to warpage-related assembly issues, and companies involved in the manufacture and assembly of these devices tend to have the most advanced warpage management programs.

Akrometrix

Effects of Packaging Materials on the Lifetime of LED Modules Under High Temperature Test

Technical Library | 2014-11-18 23:59:30.0

Performance degradation of packaging material is an important reason for the lifetime reduction of LED. In order to understanding the failure behavior of packaging material, silicone and phosphor were chosen to fabricate LED samples within which an aging test at 125℃ was performed. The result of online luminance measurement showed that LED samples with both silicone and phosphor had the highest luminance decay rate among all test samples because the carbonization of silicone and the consequent outgassing reduced the luminance quickly. The result of the luminance variance with test time was analyzed and an exponential decay model was developed with which the lifetime of LED under high temperature could be estimated.

Hubei University of Technology

Analog FastSPICE Platform Full-Circuit PLL Verification

Technical Library | 2016-06-30 14:00:32.0

When designing PLLs in nanometer CMOS, it is essential to validate the closed-loop PLL performance metrics with nanometer SPICE accuracy before going to silicon. Transistor-level, closed-loop PLL verification has been impractical due to traditional SPICE and RF simulator performance and capacity limitations. By using Analog FastSPICE, designers dont have to trade accuracy for performance. Read this white paper to see how AFS: Delivers closed-loop PLL transistor-level verification Supports direct jitter measurements Produces phase noise results correlating within 1-2dB of silicon

Mentor Graphics

Round Robin of High Frequency Test Methods by IPC-D24C Task Group

Technical Library | 2017-06-29 16:39:30.0

Currently there is no industry standard test method for measuring dielectric properties of circuit board materials at frequencies greater than about 10 GHz. Various materials vendors and test labs take different approaches to determine these properties. It is common for these different approaches to yield varying values of key properties like permittivity and loss tangent. The D-24C Task Group of IPC has developed this round robin program to assess these various methods from the "bottom up" to determine if standardized methods can be agreed upon to provide the industry with more accurate and valid characteristics of dielectrics used in high-frequency and high-speed applications.

DuPont

Using Lean Six Sigma to Optimize Critical Inputs on Solder Paste Printing

Technical Library | 2018-03-21 22:44:30.0

Solder paste printing is the first step in the surface mount manufacturing process for PCBA assembly. When the solder paste printing process is uncontrolled, defects can be produced, which may not become apparent until the PCBA is downstream. (...)This paper will discuss how Lean Six Sigma techniques were used to optimize the solder paste printing process. It will highlight how a cross-functional team used the structured Define, Measure, Analyze, Improve and Control (DMAIC) methodology to identify and control the critical inputs. The advantage of the Lean Six Sigma methodology is that it guides the team through the rigorous structured process so that all possible inputs are considered and the critical ones can be identified.

Kimball Electronics, Inc.


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