Technical Library | 2020-06-19 19:08:14.0
The designs of electronic devices and systems are being continuously improved by becoming smaller in size and faster in communication speed. The potential risk associated with these specific design improvements will be an increase in power density and, consequently, a greater risk of thermal problems and failures. At the same time, the prevailing use of circuit boards integrated with power devices such as motor controllers and drivers, light-emitting diode (LED) lighting modules, power supplies, and amplifiers, and regulators for TV, etc., drive to the use of a proper thermal management system while designing these kinds of printed circuit board (PCB).
Technical Library | 2021-12-17 01:30:28.0
Diffusion silicon pressure transmitter is applied in a wide variety of industries, such as petroleum, chemical industry, steel, power, light industry and environmental protection industry. It can complete the work of measurement and control of the gauge pressure, negative pressure or absolute pressure of various fluid pressure. Most importantly, this type of transmitter can be used in corrosive medium and harsh or dangerous environment. In the process of using the transmitter, there may be some faults or problems.
Technical Library | 2017-04-06 16:50:56.0
Silicon photonics is an IC technology where data is transferred using light that is routed on the chip using optical waveguides (Figure 1). Silicon photonics is best known as a method to solve problems with high input/output bandwidth applications. For example, because of ever-growing bandwidth requirements in datacenters, the optical transmit and receive heads are being placed closer and closer to the board and the IC. But, designers also apply this technology to biosensors, medical diagnostics, and environmental monitoring. Regardless of the application, photonic ICs always need integration to electronic circuits and this results in unique challenges.
Technical Library | 2019-11-15 02:20:26.0
Material Aging Test-UV Weathering Test Chamber 1.What is UV aging? UV aging chambers use fluorescent ultraviolet lamp as light source to simulate UV radiation and condensation in natural sunlight, and to carry out accelerated weather resistance test in order to obtain the result of weather resistance of the material. UV aging detection is widely used in non-metallic materials, organic materials (such as coatings, paints, rubber, plastics and their products) under the change of sunlight, humidity, temperature, condensation and other climatic conditions to test the aging degree and situation of related products and materials. 2.Why we should do UV aging test? When the product is placed in the ambient environment, there will be different problems taken place, such as appearance changes, including cracking, speckle, powdering or color change, and even performance degradation,which may be due to the loss of components in the resin resulting in chemical bonds changes inside the molecular structure, this is mainly caused by sunlight, industrial exclusion of waste gas, bacteria and so on. The aging performance of the product directly affects the lifespan of the product, so aging test become significant,non-metallic materials, organic materials (such as paints, paints, rubber, plastics and their products) are subject to changes in sunlight, humidity, temperature, condensation and other climatic conditions to test the degree and condition of aging of related products and materials. The natural aging test is to put the plastic specimen under the sun exposure, and it is directly under the natural climate environment,to test the material performance under various factors such as light, heat energy, atmospheric humidity, oxygen and ozone, industrial pollution and the like, the most harsh climate condition should be selected,or near the actual application area of the material, the test site shall be open and flat, no obstacle to affect the test results,the specimen holder shall be facing the equator and at an angle of 45 ° from the ground. When the main performance index of the specimen has been reduced, the test s/b terminated when it achieve the minimum allowable use value . in most case,the test is terminated when the product primary performance index falls to 50% of the initial value. The natural aging process is a very slow process, and there is a great difference in different geographical conditions, which brings difficulties to evaluate the aging resistance of the product. It is an attempt to make an evaluation of the aging performance of the plastic in a shorter time,that is accelerated aging test. The accelerated aging test can be used to simulate the human light source of the fluorescent lamp, including the carbon arc lamp, the xenon arc lamp and the fluorescent ultraviolet lamp, and the artificial light sources can generate more light than the natural sunlight on the ground. When these artificial light sources are used, it is also common to use the combination of the condenser to simulate the rain drop, the dew and the like to conduct the aging test on the product.
Technical Library | 2016-04-14 13:49:44.0
A system level test, usually built-in test (BIT), determines that one or more subsystems are faulty. These subsystems sent to the depot or factory repair facility, called units under test (UUTs) often pass that test, an event we call No-Fault-Found (NFF). With more-and more electronics monitored by BIT, it is more likely that an intermittent glitch will trigger a call for a maintenance action resulting in NFF. NFFs are often confused with false alarm (FA), cannot duplicate (CNDs)or retest OK (RTOK) events. NFFs at the depot are caused by FAs, CNDs, RTOKs as well as a number of other complications. Attempting to repair NFF scan waste precious resources, compromise confidence in the product, create customer dissatisfaction, and the repair quality remains a mystery. The problem is compounded by previous work showing that most failure indications calling for repair action at the system level are invalid. NFFs can be caused by real failures or may be a result of system level false alarms. Understanding the cause of the problem may help us distinguish between units under test (UUTs) that we can repair and those that we cannot. In calculating the true cost of repair we must account for wasted effort in attempting to repair unrepairable UUTs.This paper will shed some light on this trade-off. Finally, we will explore approaches for dealing with the NFF issue in a cost effective manner.
Technical Library | 2024-04-29 21:39:52.0
In this paper, we develop and put into practice an Automatic Optical Inspection (AOI) system based on machine vision to check the holes on a printed circuit board (PCB). We incorporate the hardware and software. For the hardware part, we combine a PC, the three-axis positioning system, a lighting device and CCD cameras. For the software part, we utilize image registration, image segmentation, drill numbering, drill contrast, and defect displays to achieve this system. Results indicated that an accuracy of 5µm could be achieved in errors of the PCB holes allowing comparisons to be made. This is significant in inspecting the missing, the multi-hole and the incorrect location of the holes. However, previous work only focusses on one or other feature of the holes. Our research is able to assess multiple features: missing holes, incorrectly located holes and excessive holes. Equally, our results could be displayed as a bar chart and target plot. This has not been achieved before. These displays help users analyze the causes of errors and immediately correct the problems. Additionally, this AOI system is valuable for checking a large number of holes and finding out the defective ones on a PCB. Meanwhile, we apply a 0.1mm image resolution which is better than others used in industry. We set a detecting standard based on 2mm diameter of circles to diagnose the quality of the holes within 10 seconds.
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