Technical Library: peters (Page 2 of 3)

Case Study on the Validation of SAC305 and SnCu Based Solders in SMT, Wave and Hand-soldering at the Contract Assembler Level

Technical Library | 2007-11-15 15:54:44.0

At the contractor level once a product is required to be soldered with lead-free solders all the processes must be assessed as to insure the same quality a customer has been accustomed to with a Sn63Pb37 process is achieved. The reflow, wave soldering and hand assembly processes must all be optimized carefully to insure good joint formation as per the appropriate class of electronics with new solder alloys and often new fluxes.

Kester

Optimizing Flip Chip Substrate Layout for Assembly

Technical Library | 2007-11-29 17:20:31.0

Programs have been developed to predict the expected yield of flip chip assemblies, based on substrate design and the statistics of actual manufactured boards, as well as placement machine accuracy, variations in bump sizes, and possible substrate warpage. These predictions and the trends they reveal can be used to direct changes in design so that defect levels will fall below the acceptable limits. Shapes of joints are calculated analytically, or when this is not possible, numerically by means of a public domain program called Surface Evolver. The method is illustrated with an example involving the substrate for a flip chip BGA.

Universal Instruments Corporation

Developing a Reliable Lead-free SMT Process

Technical Library | 2008-01-03 17:50:51.0

Lead-free SMT can be achieved reliably if several process requirements are implemented carefully. Some of the variables to account for are listed below. The most common alloys used in lead-free SMT are tin-silver-copper alloys; these alloys all have a meting range between 217- 220°C. These alloys all melt at higher temperatures than traditional leaded solders such as the 63/37which has a melting point of 183 °C.

Kester

Lead-free Wave Soldering of Simple to Highly Complex Boards. Process Optimization

Technical Library | 2008-01-10 19:24:48.0

This research takes an in-depth look at the challenges encountered in developing a lead free wave soldering process based on the specific products as well as on specific materials. It attempts to provide the reader with the information necessary to make educated decisions in selecting materials and controlling various process parameters in order to execute a rational implementation strategy for a reliable and robust lead free wave soldering process.

Vitronics Soltec

Lead-Free Reliability - Building It Right The First Time

Technical Library | 2008-07-01 18:59:09.0

As lead-free and RoHS compliancy fast approaches, it is more important than ever to build it right the first time. Lead-free assembly and RoHS will bring about numerous changes and the number of variables with which to contend is increasing, creating increased risk of defects and reduced product reliability. However, understanding what the variables are and their impact on the assembly can great increase product reliability.

Kester

Flexible Termination - Reliability in Stringent Environments

Technical Library | 2009-05-21 13:41:05.0

Failure due to board flex cracks persists as the dominant failure mode in multi-layer ceramic capacitors (MLCC). (...) This paper is intended to show the impact of temperature cycling, high-temperature life tests, and multiple bend exposures to the MLCC with this flexible termination.

KEMET Electronics Corporation

The Relationship between Backward Compatible Assembly and Microstructure on the Thermal Fatigue Reliability of an Extremely Large Ball Grid Array

Technical Library | 2012-06-21 23:06:06.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. Most high reliability electronic equipment producers continue to manufacture and support tin-lead (SnPb) electronic products despite the increasing trend for design and conversion

Alcatel-Lucent

The Long-term Shaping of the JTAG/Boundary-scan Standards

Technical Library | 2015-05-11 21:27:52.0

Originating from the last millenium, almost three decades ago, the introduction of surface mount packaging triggered a wave of changes throughout many aspects of electronics production. A small number of talented, innovative test engineers from various big players of the industry started to attend meetings to discuss the impact of that change of technology on their future test concepts for modern assemblies. The Joint Test Action Group was born.

JTAG Technologies B. V.

Key Technology Choices For Optimal Massive IoT Devices

Technical Library | 2019-11-26 15:57:27.0

The latest cellular communication technologies LTE-M and NB-IoT enable the introduction of a new generation of IoT devices that deliver on the promise of scalable, cost-effective massive IoT applications using LPWAN technology. However, a few key technology choices are necessary to create IoT devices that can support the multitude of existing and emerging massive IoT use cases..

Ericsson AB

Coordinating Hundreds of Cooperative, Autonomous Vehicles in Warehouses

Technical Library | 2022-01-12 19:17:37.0

Occasionally, mature industries are turned upside down by innovations. The years of research on robotics and multiagent systems are coming together to provide just such a disruption to the material-handling industry. While autonomous guided vehicles (AGVs) have been used to move material within warehouses since the 1950s, they have been used primarily to transport very large, very heavy objects like rolls of uncut paper or engine blocks.

Association for the Advancement of Artificial Intelligence


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