Technical Library: polarity for part (Page 1 of 3)

Preparation for Reflow Profiling

Technical Library | 2019-05-24 09:22:59.0

There is a smaller process window and a much narrower margin of error when creating and using lead-free reflow profiles for surface mount parts on printed circuit boards (PCBs). Solder balls, dewetting, tombstones, voids, and head-on-pillow problems will occur much more frequently because lead-free alloys behave differently than eutectic pastes. Problems are compounded due to the extra heat necessary for some lead-free pastes to reach their melting points.

ACI Technologies, Inc.

Design of Experimentation for Affordability

Technical Library | 2019-07-11 11:07:08.0

Affordability is not exactly the primary word which comes to mind when discussing the use of design of experiments (DOE) principles, but is generally accepted as a necessary part of the engineering activities required in the development of a product or process. However, a number of studies have indicated that the cost savings derived from a well deliberated experimental design can be substantial in the initial stages where the conditions or parameters of a process are determined. Some studies have shown a greater than 50% cost savings compared to the more conventional means of trial and error approaches to process development. At ACI Technologies (ACI), we have found the use of DOE techniques fundamental in eliminating extraneous costs otherwise spent on unnecessary testing.

ACI Technologies, Inc.

Screening for Counterfeit Electronic Parts

Technical Library | 2014-02-20 15:59:17.0

In this chapter, we discuss the type of parts used to create counterfeits and the defects/degradations inherent in these parts due to the nature of the sources they come from, proposed inspection standards, and limitations of these standards. The processes used to modify the packaging of these parts to create counterfeits are then discussed along with the traces left behind from each of the processes. We then present a systematic methodology for detecting signs of possible part modifications to determine the risk of a part or part lot being counterfeit.

CALCE Center for Advanced Life Cycle Engineering

A Unified CAD-PLM Architecture for Improving Electronics Design Productivity through Automation, Collaboration, and Cloud Computing

Technical Library | 2012-01-26 20:28:34.0

In electronics design, Computer Aided Design (CAD) tools manage part data in a logical schematic view (a part symbol) and a physical PCB view (a part footprint). Yet, a part has a third view, which CAD tools ignore – its supply data (Manufacturer part num

UCLA - Networked & Embedded Systems Laboratory

Advanced Physical Inspection Methods for Counterfeit IC Detection

Technical Library | 2021-10-12 18:05:09.0

The remarkable increase in counterfeit parts (a factor of 4 since 2009) [1] is a huge reliability and security concern in various industries ranging from automotive electronics to sensitive military applications increasing the possibility of premature failure in critical systems [2-5]. Counterfeit parts can also incur a great financial loss to legitimate electronics companies [6]. The issue is even more alarming as the counterfeiters use more sophisticated methods making counterfeit detection a much harder task [7-8]. Therefore, it is reasonable to develop more advanced counterfeit detection methods targeting a more efficient detection of sophisticated counterfeited parts.

University of Connecticut

Recommendations for Installing Flash LEDs on Flex Circuits

Technical Library | 2009-12-09 19:47:15.0

For the mobile market some PCB assemblies have been converted to flex circuit assemblies, in part because flex circuit assembly can be twisted or bent per the application needs. Flex circuits offer the same advantages as conventional printed circuit boards: quality, reliability, and high density.

Avago Technologies

Guide for the Design of Semiconductor Equipment to Meet Voltage Sag Immunity Standards

Technical Library | 1999-08-05 09:51:47.0

This document summarizes the finding of testing to determine the immunity of semiconductor equipment to voltage sag events. Based in part on the findings, global standards have been adopted to define voltage sag immunity requirements for semiconductor equipment...

SEMATECH

New Life for Aging Electronic Products

Technical Library | 2008-10-01 13:03:00.0

Many Original Equipment Manufacturers, (OEM’s), struggle to continue shipping aging or obsolete electronic products. Electronic products designed five to ten years ago are still relevant in the marketplace. Often these venerable old products have gained particular acceptance amongst a select group of customers. In many cases these old products fulfill a need in a unique manner. Examples include: designs that are grandfathered into an application due to regulatory considerations; designs having unique form-fit-and-function; designs running special software ; designs subject to contractual support and service requirements; designs in which a new contract stipulates delivery of older gear as part of a larger system offering. Any one or all of these reasons can lead an OEM to continue the production of electronic equipment well into its end of useful component life

Orchid Technologies Engineering & Consulting, Inc.

Medical Device Manufacturing: Designing for X-ray Inspection

Technical Library | 2023-11-20 18:18:34.0

When x-ray inspection is used as part of a quality assurance program for any assembled device, steps must be taken early in the design stage to anticipate the use of x-ray inspection later in the development and production processes. This is a lesson that electronic assembly manufacturers learned years ago, and that medical device manufacturers are also discovering. There are several steps involved in learning how to interpret x-ray images, and how to design for x-ray inspection. First, manufacturers need to understand the nature of the x-ray shadow and its modalities; then they need to see how medical device developers and manufacturers are using x-ray inspection; finally, they need to consider taking measures early in the design process to ensure a clear, accurate image when the assembled device undergoes x-ray inspection.

Glenbrook Technologies

New Precision Coating Deposition Method for Photovoltaic Manufacturing

Technical Library | 2009-05-28 18:15:46.0

Considerable effort is ongoing to improve the efficiency and to move towards high-volume manufacturing of photovoltaic cells. Much attention has been focused on developing in-line processes to replace the current batch processes. A critical process to improve the performance of solar wafers is the application of Dopants. The basic requirement for this process is an automated method for applying a very thin, uniform film of Dopant to the silicon wafer as part of an in-line manufacturing process.

Ultrasonic Systems, Inc.

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