Technical Library | 2019-05-16 02:25:15.0
limatest Symor wants to tell you that humidity is not only the most important thing in the chamber, but also the temperature In order to facilitate customers to add water, our temperature and humidity test chamber is to place the water tank at back of the equipment.Just open the baffle to see the water tank and the water level meter next to the tank,then add enough water to the tank. However, in addition to manual water addition, our temperature and humidity test chamber has equipment that can automatically add water. Only by connecting the water pipe at the water filling port can it be automatically replenished when there is a shortage of water, which is suitable for high humidity test for a long time.
Technical Library | 2010-08-05 18:39:39.0
Variability analysis is important in successfully deploying multi-gigabit backplane printed wiring boards (PWBs) with growing numbers of high-speed SerDes links. We discuss the need for large sample sizes to obtain accurate variability estimates of SI me
Technical Library | 2015-12-17 17:24:17.0
Product quality can be improved through proper application of design for test (DFT) strategies. With today's shrinking product sizes and increasing functionality, it is difficult to get good test coverage of loaded printed circuit boards due to the loss of test access. Advances in test techniques, such as boundary scan, help to recover this loss of test coverage. However, many of these test techniques need to be designed into the product to be effective.This paper will discuss how to maximize the benefits of boundary scan test, including specific examples of how designers should select the right component, connect multiple boundary scan components in chains, add test access to the boundary scan TAP ports, etc. A discussion of DFT guidelines for PCB layout designers is also included. Finally, this paper will include a description of some advanced test methods used in in-circuit tests, such as vectorless test and special probing methods, which are implemented to improve test coverage on printed circuit boards with limited test access.
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