Technical Library: study (Page 6 of 20)

Thermal Cycle Reliability Study of Vapor Phase BGA Solder Joints

Technical Library | 2012-09-13 20:45:17.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. Prior to committing production boards to vapor phase soldering, we performed an evaluation to assess reliability and evaluate the vacuum soldering option. The reliability of vapor

Agilent Technologies, Inc.

Package on Package (PoP) Stacking and Board Level Reliability, Results of Joint Industry Study

Technical Library | 2007-08-02 13:24:23.0

This paper presents the results of a joint - three way study between Amkor Technology, Panasonic Factory Solutions and Spansion in the area of package on package (PoP) board level reliability (BLR) (...) The scope of this paper is to cover the already popular 14 x 14mm PoP package size that provides a 152 pin stacked interface which supports a high level of flexibility in the memory architecture for multimedia requirements.

Amkor Technology, Inc.

Lean Kitting: A Case Study

Technical Library | 2008-08-20 17:28:19.0

Kitting is the first step in printed circuit board assembly. It is initiated well in advance of the actual production start to be able to prepare and deliver the kit on time. Kitting involves the gathering of all the parts needed for a particular assembly from the stockroom and issuing the kit to the manufacturing line at the right time and in the right quantity. This paper discusses kitting, describes ways to eliminate waste in different phases of kitting, and illustrates lean kitting using a case study conducted in a major contract manufacturer site.

Optimal Electronics Corporation

Component Reliability After Long Term Storage

Technical Library | 2009-12-03 12:51:58.0

Each year the semiconductor industry routes a significant volume of devices to recycling sites for no reliability or quality rationale beyond the fact that those devices were stored on a warehouse shelf for two years. This study identifies the key risks attributed to extended storage of devices in uncontrolled indoor environments and the risk mitigation required to permit safe shelf-life extension.

Texas Instruments

A PROM Element Based on Salicide Agglomeration of Poly Fuses in a CMOS Logic Process

Technical Library | 1999-05-07 10:18:34.0

A novel programmable element has been developed and evaluated for state of the art CMOS processes. This element is based on agglomeration of tVarious aspects of these programmable devices including characterization and optimization of physical and electrical aspects of the element, programming yield, and reliability have been studied. Development ofhe Ti-silicide layer on top of poly fuses.

Intel Corporation

The Effect Of Metallic Impurities On The Wetting Properties Of Solder

Technical Library | 1999-05-07 10:38:11.0

This paper is a report of a study made to determine the maximum allowable impurities in solder used for wave soldering applications. This report concludes with a list of impurities compiled from actual analyses of solder which caused production problems. A list of recommended maximum allowable impurities will assist in establishing reliable quality controls on the purity level of the solder in a wave soldering machine.

Kester

Assembly And Reliability Issues Associated With Leadless Chip Scale Packages

Technical Library | 2006-10-02 14:26:47.0

This paper addresses the assembly and reliability of 0.5 mm pitch leadless Chip Scale Packages (CSP) on .062" immersion Ag plated printed circuit boards (PCB) using Pb-free solder paste. Four different leadless CSP designs were studied and each was evaluated using multiple PCB attachment pad designs.

Universal Instruments Corporation

Effects of Assebly Process Variables on Voiding at a Thermal Interface.

Technical Library | 2007-04-04 11:43:41.0

The present work offers a discussion and a first case study to identify and illustrate voiding mechanisms for a particular TIM between a heat spreader and the back of a flip chip. Pronounced differences were observed between stencil printing and dispensing in terms of initial void formation, apparently related to the specific properties of the material. Measurements of the effects of heat ramp rate and peak temperature showed the subsequent evolution and final void size distribution to be determined by the initial part of the cure profile up to the material gelling temperature.

Universal Instruments Corporation

Implementing Lead Free Soldering - European Consortium Research

Technical Library | 2007-07-12 14:29:37.0

Over the last ten years, there have been a large number of publications describing work into lead free electronics soldering. They have come from all regions of the world and from academic organisations, individual companies and consortia. Although a number of these studies have culminated in "production trials", these have invariably been on a limited scale and they were essentially a demonstration, rather than the first step to implementation.

Multicore Solders

Tackling SMT Enemy Number One - Raising The Standard of Solder Paste Application

Technical Library | 2009-05-14 13:57:43.0

Is screen printing technology able to keep pace with rising quality demands and increasingly complex board layouts? Or, is new jet printing technology ready to fill the gap? A comparison study between the two methods reveals some interesting differences. Screen printers offer some possibilities for optimizing solder paste deposits, but optimization is far easier and quicker with the jet printer. At the same time, the ability to print individualized deposits on every single pcb pad may be the ultimate answer to the growing quality challenge.

Mycronic Technologies AB


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