Technical Library: testing (Page 12 of 35)

Guide for the Design of Semiconductor Equipment to Meet Voltage Sag Immunity Standards

Technical Library | 1999-08-05 09:51:47.0

This document summarizes the finding of testing to determine the immunity of semiconductor equipment to voltage sag events. Based in part on the findings, global standards have been adopted to define voltage sag immunity requirements for semiconductor equipment...

SEMATECH

If you bear the cost of your product's failure, shouldn't you have a say in ensuring it's success?

Technical Library | 2009-04-09 20:43:09.0

Evidence has come to light that increased solder process temperatures, specifically for lead free solder, are dramatically shortening life expectancy of components; failures do not show up during initial test, but much later on in the products life,

Electronic Controls Design Inc. (ECD)

Validity of the IPC R.O.S.E. Method 2.3.25 Researched

Technical Library | 2010-06-10 21:01:48.0

This paper researches the effectiveness of the R.O.S.E. cleanliness testing process for dissolving and measuring ionic contaminants from boards soldered with no-clean and lead-free flux technologies.

KYZEN Corporation

Total Loss: How to Qualify Circuit Boards

Technical Library | 2011-05-12 19:04:05.0

We clarify the role of signal loss measurements, aka Total Loss, in specifying and qualifying circuit board materials for high-speed electronic design. We then demonstrate the NIST Multiline measurement technique in particular by characterizing test line

Connected Community Networks, Inc.

Use of Non Etching Adhesion Promoters in Advanced PCB Applications

Technical Library | 2011-06-16 18:59:43.0

Based on tests carried out with commercially available chemistry, this paper discusses the advantages available through the use of NEAP processes for inner layer bonding and soldermask pretreatment. The process is characterized with a view to high volume

Atotech

Hermetically Sealed SMD Tantalum Capacitors

Technical Library | 2011-12-15 17:21:42.0

manganese dioxide or conductive polymer cathode. Higher stability is achieved by placement of the capacitor into an SMD case filled by an inert atmosphere and hermetically sealed. The long term stability testing performed on such hermetically sealed capac

AVX Corporation

Maximize Test Coverage While Optimizing Costs

Technical Library | 2013-05-10 18:12:15.0

In today’s manufacturing environments, optimizing manufacturing costs and, especially Test and Inspection costs are high on most company’s agendas. Resources are tight and many employees have multiple roles to fulfill across the whole manufacturing line so, time is limited. Test suppliers need to provide a suite of tools to ensure the highest level of quality for customer shipments.

Digitaltest Inc.

Bond Test Measurement Accuracy

Technical Library | 2016-08-23 06:16:35.0

While many things can affect the force measurement accuracy of a bond test, its ultimate limitation is that of the force sensor. With advances in technology, accuracy can be dramatically improved with no cost penalty and no need to select force measurement ranges. How is this accomplished?

XYZTEC bv

How to extend the lifespan of climatic test chamber?

Technical Library | 2019-05-06 23:13:09.0

Temperature and humidity test chamber has brought a lot of help to many industrial enterprises, but while it brings convenience to us, we should also take good care of them, otherwise they may be brought into the end-of-life phase ahead of time. The way of maintenance is also very simple. After daily use, the equipment is cleaned regularly, but the cleaning of the test chamber is also very skillful. If the operation is wrong, it may also lead to equipment failure. Let‘s learn how to extend the service life of the temperature and humidity test box together. 1, Pls clean the working room with water after each use, then dry the interior with dry cotton cloth. 2, Pls regularly remove dust from the evaporator inside the equipment, and periodically wipe the equipment to ensure clean and tidy. 3, When doing the test, the sample should be uniformly placed onto sample shelves,and the vent should not be blocked to prevent the influence of the test 4, It is necessary to pay attention to the cleaning of water tanks in peacetime, after the test or when the equipment is not intended to be used for a long time, all the water in the tank should be discharged, otherwise it will lead to the formation of scale inside the tank. The water used in the temperature and humidity test chamber must be pure or distilled water, or long-term use may result in a humidifier or internal pipe clogging. Above are the usual use notice of temperature and humidity test chamber, if customer adhere to the above several points,it is really able to prolong the service life of the equipment.

Symor Instrument Equipment Co.,Ltd

Characterization of No Clean Solderpaste Residues: The Relationship to In-Circuit Testing

Technical Library | 1999-05-07 11:24:21.0

Many manufacturers have now completed the conversion to no clean solder paste. Many factors governed this initial conversion, among those being cosmetics, solder ability, and process ability. In circuit testing or probing through no clean solder paste residues has topically not been a major factor in the conversion decision for several reasons. Due to board design, solder paste was only used on one side of the board and not subjected to testing...

Kester


testing searches for Companies, Equipment, Machines, Suppliers & Information