Technical Library: works (Page 13 of 14)

How to extend the lifespan of climatic test chamber?

Technical Library | 2019-05-06 23:13:09.0

Temperature and humidity test chamber has brought a lot of help to many industrial enterprises, but while it brings convenience to us, we should also take good care of them, otherwise they may be brought into the end-of-life phase ahead of time. The way of maintenance is also very simple. After daily use, the equipment is cleaned regularly, but the cleaning of the test chamber is also very skillful. If the operation is wrong, it may also lead to equipment failure. Let‘s learn how to extend the service life of the temperature and humidity test box together. 1, Pls clean the working room with water after each use, then dry the interior with dry cotton cloth. 2, Pls regularly remove dust from the evaporator inside the equipment, and periodically wipe the equipment to ensure clean and tidy. 3, When doing the test, the sample should be uniformly placed onto sample shelves,and the vent should not be blocked to prevent the influence of the test 4, It is necessary to pay attention to the cleaning of water tanks in peacetime, after the test or when the equipment is not intended to be used for a long time, all the water in the tank should be discharged, otherwise it will lead to the formation of scale inside the tank. The water used in the temperature and humidity test chamber must be pure or distilled water, or long-term use may result in a humidifier or internal pipe clogging. Above are the usual use notice of temperature and humidity test chamber, if customer adhere to the above several points,it is really able to prolong the service life of the equipment.

Symor Instrument Equipment Co.,Ltd

Serious to make dry oven

Technical Library | 2019-11-13 02:09:44.0

Dry oven is a must instrument almost for every laboratory in different industries,with nearly 20 years efforts and innovation,Climatest now masters core technique of dry oven manufacturing,no matter on temperature uniformity or temperature stability.Behind the quality is 15 years of consistent persistence,strong belief in excellence; from design to R & D to production, from promotion to sales to installation; every step should reach excellence,What you see, you use our products, you choose, you feel that we do our best,this is our faith. Dry Ovens are used to dry or temper electronic components,material tests,torrefaction, wax-melting ,high temperature aging ,preheating and sterilization in industrial and mining enterprises, laboratories and scientific research institutes. .Exterior chamber is made by reinforced steel with painting; working chamber made by anti-corrosion stainless steel SUS#304 .Intelligent PID control, LED controller with over-temperature alarm,timing range within 0~9999min .Hot air circulation system composed of Germany imported low-noisy air blower and optimal air duct which ensure uniform temperature distribution .Double layers of glass door, large transparent window to observe specimen .Forced air convection Climatest manufactures desktop and floor-standing models with RT+10°C-200°C,250°C,300°C,350°C,400°C temperature range,and customized as per special requirement,if you wanna know more details about our dry oven,please visit our product page:https://climatechambers.com/industrial-dry-oven/200-degree-c-hot-air-oven.html

Symor Instrument Equipment Co.,Ltd

Waste-Printed Circuit Board Recycling: Focusing on Preparing Polymer Composites and Geopolymers

Technical Library | 2021-06-07 19:03:05.0

The waste from end-of-life electrical and electronic equipment has become the fastest growing waste problem in the world. The difficult-to-treat waste-printed circuit boards (WPCBs), which are nearly 3−6 wt % of the total electronic waste, generate great environmental concern nowadays. For WPCB treatment and recycling, the mechanical−physical method has turned out to be more technologically and economically feasible. In this work, the mechanical−physical treatment and recycling technologies for WPCBs were investigated, and future research was directed as well. Removing electric and electronic components(EECs) from WPCBs is critical for their crushing and metal recovery; however, environmentally friendly and high-efficiency removal techniques need be developed. Concentrated metals rich in Cu, Al, Au, Pb, and Sn recovered from WPCBs need be further refined to add to their economic values. The low value added nonmetallic fraction of waste-printed circuit boards (NMF-WPCBs) accounts for approximately 60 wt % of the WPCBs. From the perspective of environmental management, a zero-waste approach to recycling them should be developed to gain values. Preparing polymer composites and geopolymers offers many advantages and has potential applications in various fields, especially as construction and building materials. However, the mechanical and thermal properties of NMF-WPCBs composites should be further improved for preparing polymer composites. Surface modification or filler blending could be applied to improve the interfacial comparability between NMF-WPCBs and the polymer matrix. The NMFWPCBs shows potential in preparing cement mortar and geological polymers, but the environmental safety resulting from metals needs to be taken into account. This study will provide a significant reference for the industrial recycling of NMF-WPCBs

Zhejiang University

Evaluation of No-Clean Flux Residues Remaining After Secondary Process Operations

Technical Library | 2023-04-17 17:05:47.0

In an ideal world, manufacturing devices would work all of the time, however, every company receives customer returns for a variety of reasons. If these returned parts contributed to a fail, most companies will perform failure analysis (FA) on the returned parts to determine the root cause of the failure. Failure can occur for a multitude of reasons, for example: wear out, fatigue, design issues, manufacturing flaw or defect. This information is then used to improve the overall quality of the product and prevent reoccurrence. If no defect is found, it is possible that in fact the product has no defect. On the other hand, the defect could be elusive and the FA techniques insufficient to detect said deficiency. No-clean flux residues can cause intermittent or elusive, hard to find defects. In an attempt to understand the effects of no-clean flux residues from the secondary soldering and cleaning processes, a matrix of varying process and cleaning operation was investigated. Of special interest, traveling flux residues and entrapped residues were examined, as well as localized and batch cleaning processes. Various techniques were employed to test the remaining residues in order to assess their propensity to cause a latent failure. These techniques include Surface Insulation Resistance1 (SIR) testing at 40⁰C/90% RH, 5 VDC bias along with C32 testing and Ion Exchange Chromatography (IC). These techniques facilitate the assessment of the capillary effect the tight spacing these component structures have when flux residues are present. It is expected that dendritic shorting and measurable current leakage will occur, indicating a failing SIR test. However, since the residue resides under the discrete components, there will be no visual evidence of dendritic growth or metal migration.

Foresite Inc.

A Machine Vision Based Automatic Optical Inspection System for Measuring Drilling Quality of Printed Circuit Boards

Technical Library | 2024-04-29 21:39:52.0

In this paper, we develop and put into practice an Automatic Optical Inspection (AOI) system based on machine vision to check the holes on a printed circuit board (PCB). We incorporate the hardware and software. For the hardware part, we combine a PC, the three-axis positioning system, a lighting device and CCD cameras. For the software part, we utilize image registration, image segmentation, drill numbering, drill contrast, and defect displays to achieve this system. Results indicated that an accuracy of 5µm could be achieved in errors of the PCB holes allowing comparisons to be made. This is significant in inspecting the missing, the multi-hole and the incorrect location of the holes. However, previous work only focusses on one or other feature of the holes. Our research is able to assess multiple features: missing holes, incorrectly located holes and excessive holes. Equally, our results could be displayed as a bar chart and target plot. This has not been achieved before. These displays help users analyze the causes of errors and immediately correct the problems. Additionally, this AOI system is valuable for checking a large number of holes and finding out the defective ones on a PCB. Meanwhile, we apply a 0.1mm image resolution which is better than others used in industry. We set a detecting standard based on 2mm diameter of circles to diagnose the quality of the holes within 10 seconds.

National Cheng Kung University

Maintenance and operation of walk-in temperature humidity test chamber

Technical Library | 2019-11-17 22:46:45.0

Overview of walk-in temperature and humidity chamber: It also belongs to environmental test equipment, it tests whether the product can resist high temperature, low temperature, humidity, or the physical and chemical changes produced under extreme conditions, the walk-in temperature and humidity chamber volume is large, the product is placed, or a large object can be placed, such as automobile, new energy, television and liquid crystal screen, etc. How to do the routine maintenance of the walk-in temperature and humidity chamber: 1. The wet gauze basically, if there is no special case, s/b usually changed once in 3 months 2. The water channel shall be regularly cleaned, including water cup, water tank, etc., so as to prevent the water from being blocked,affect the humidity test. 3. It is forbidden to test the flammable and explosive products inside working room. 4. Clean the chamber on a regular basis 2. How to operate walk-in temperature and humidity chamber: The operation method is same as standard temperature humidity test chamber,the controller is 7-inch LCD programmable color screen, you only need to setthe temperature point---test time--how many cycles need to be tested, This can be done automatically, and the machine will stop automatically when it is complete. If there is any problem during the operation, the corresponding problem point will be displayed on the machine control screen. Walk-in temperature and humidity chamber is a must equipment for reliability test of Automobile,Aerospace,Electronic parts,etc,the operation and maintenance are easy,it is teh tear down mahcine,Climatest engineers will be dispatched to do on-site support,for instance,we will finish commissioning,train customers how to operate,maintain,welcome to follow our company facebook page:https://www.facebook.com/Climatechambers

Symor Instrument Equipment Co.,Ltd

What causes temperature humidity chamber to alarm?

Technical Library | 2019-12-12 02:43:44.0

Today we discuss the reason that causes temperature humidity chamber to alarm,In most cases, the equipment alarm is caused by the improper operation in the process of use, which mainly includes following reasons:that are refrigeration system, temperature system and circulating system. First, Refrigeration system 1, refrigeration compressor overpressure alarm. If the refrigerant pressure exceeds the set value, it will stop and alarm at the same time. At this time, the fault must be eliminated and then manually reset. 2, short phase power supply, phase sequence alarm. When the external power supply of the equipment is out of phase or the phase sequence is changed, it will stop and alarm at the same time. 3. The circulating cooling water is short of water to alarm. When the water pressure of the cooling circulating water system is insufficient, it will stop and alarm at the same time, and it must wait for the fault to be eliminated and reset at the same time before it could run normally. 4, refrigeration compressor overheating alarm. When the coil of the compressor is overheated and the power supply of the line is not normal, it will stop and alarm at the same time. Second, Temperature system 1, the overtemperature alarm in the chamber. The sensors in the channel and the sample area are equipped with overtemperature protection devices, and there are also overtemperature protecter on the control panel. When the temperature in the working chamber exceeds the setting value on the controller, it will stop and alarm. 2. sample overtemperature protection. When the temperature in the sample area exceeds the protection temperature set by the controller, it will stop and alarm at the same time. The overtemperature protection of the sample is divided into upper limit protection and lower limit protection, which can be set according to the demand, Third,Circulating system 1. The alarm is caused by the overheating of the circulating fan. When the coil of the fan is over-heated, the alarm will be stopped at the same time. 2. The fan over-current alarm. When the current of the fan exceeds the allowable value, the alarm is stopped at the same time, and the normal operation can only be carried out after the fault maintenance of the overcurrent is completed. This is what we talk about today,if you have more questions,let us know.

Symor Instrument Equipment Co.,Ltd

The Risk And Solution For No-Clean Flux Not Fully Dried Under Component Terminations the Risk And Solution For No-Clean Flux Not Fully Dried Under Component Terminations

Technical Library | 2020-11-24 23:01:04.0

The miniaturization trend is driving industry to adopting low standoff components or components in cavity. The cost reduction pressure is pushing telecommunication industry to combine assembly of components and electromagnetic shield in one single reflow process. As a result, the flux outgassing/drying is getting very difficult for devices due to poor venting channel. This resulted in insufficiently dried/burnt-off flux residue. For a properly formulated flux, the remaining flux activity posed no issue in a dried flux residue for no-clean process. However, when venting channel is blocked, not only solvents remain, but also activators could not be burnt off. The presence of solvents allows mobility of active ingredients and the associated corrosion, thus poses a major threat to the reliability. In this work, a new halogen-free no-clean SnAgCu solder paste, 33-76-1, has been developed. This solder paste exhibited SIR value above the IPC spec 100 MΩ without any dendrite formation, even with a wet flux residue on the comb pattern. The wet flux residue was caused by covering the comb pattern with 10 mm × 10 mm glass slide during reflow and SIR testing in order to mimic the poorly vented low standoff components. The paste 33-76-1 also showed very good SMT assembly performance, including voiding of QFN and HIP resistance. The wetting ability of paste 33-76-1 was very good under nitrogen. For air reflow, 33-76-1 still matched paste C which is widely accepted by industry for air reflow process. The above good performance on both non-corrosivity with wet flux residue and robust SMT process can only be accomplished through a breakthrough in flux technology.

Indium Corporation

A Study on Effects of Copper Wrap Specifications on Printed Circuit Board Reliability

Technical Library | 2021-07-20 20:02:29.0

During the manufacturing of printed circuit boards (PCBs) for a Flight Project, it was found that a European manufacturer was building its boards to a European standard that had no requirement for copper wrap on the vias. The amount of copper wrap that was measured on coupons from the panel containing the boards of interest was less than the amount specified in IPC-6012 Rev B, Class 3. To help determine the reliability and usability of the boards, three sets of tests and a simulation were run. The test results, along with results of simulation and destructive physical analysis, are presented in this paper. The first experiment involved subjecting coupons from the panels supplied by the European manufacturer to thermal cycling. After 17 000 cycles, the test was stopped with no failures. A second set of accelerated tests involved comparing the thermal fatigue life of test samples made from FR4 and polyimide with varying amounts of copper wrap. Again, the testing did not reveal any failures. The third test involved using interconnect stress test coupons with through-hole vias and blind vias that were subjected to elevated temperatures to accelerate fatigue failures. While there were failures, as expected, the failures were at barrel cracks. In addition to the experiments, this paper also discusses the results of finite-element analysis using simulation software that was used to model plated-through holes under thermal stress using a steady-state analysis, also showing the main failure mode was barrel cracking. The tests show that although copper wrap was sought as a better alternative to butt joints between barrel plating and copper foil layers, manufacturability remains challenging and attempts to meet the requirements often result in features that reduce the reliability of the boards. Experimental and simulation work discussed in this paper indicate that the standard requirements for copper wrap are not contributing to the overall board reliability, although it should be added that a design with a butt joint is going to be a higher risk than a reduced copper wrap design. The study further shows that procurement requirements for wrap plating thickness from Class 3 to Class 2 would pose little risk to reliability (minimum 5 μm/0.197 mil for all via types).Experimental results corroborated by modeling indicate that the stress maxima are internal to the barrels rather than at the wrap location. In fact, the existence of Cu wrap was determined to have no appreciable effect on reliability.

NASA Office Of Safety And Mission Assurance

Cleaning Flux Residue under Leadless Components using Objective Evidence to Determine Cleaning Performance

Technical Library | 2019-08-14 22:20:55.0

Cleanliness is a product of design, including component density, standoff height and the cleaning equipment’s ability to deliver the cleaning agent to the source of residue. The presence of manufacturing process soil, such as flux residue, incompletely activated flux, incompletely cured solder masks, debris from handling and processing fixtures, and incomplete removal of cleaning fluids can hinder the functional lifetime of the product. Contaminates trapped under a component are more problematic to failure. Advanced test methods are needed to obtain "objective evidence" for removing flux residues under leadless components.Cleaning process performance is a function of cleaning capacity and defined cleanliness. Cleaning performance can be influenced by the PCB design, cleaning material, cleaning machine, reflow conditions and a wide range of process parameters.This research project is designed to study visual flux residues trapped under the bottom termination of leadless components. This paper will research a non-destructive visual method that can be used to study the cleanability of solder pastes, cleaning material effectiveness for the soil, cleaning machine effectiveness and process parameters needed to render a clean part.

KYZEN Corporation


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