Technical Library: x-ray control console (Page 1 of 1)

SMD SMT X-Ray Offline Component Counting Machine - Accurate Inventory Control

Technical Library | 2023-09-15 11:14:33.0

Optimize your inventory management with our SMD SMT X-Ray Offline Component Counting Machine. Ensure precise and efficient component counting with advanced X-ray technology. Enhance your operational efficiency and inventory accuracy for SMD and SMT components. Explore how this machine can revolutionize your component counting process and streamline your operations.

I.C.T ( Dongguan ICT Technology Co., Ltd. )

X-RAY FURTHER INCREASES PRODUCT QUALITY AT MENTZER ELECTRONICS

Technical Library | 2023-11-20 17:59:32.0

Quality control at Mentzer Electronics in Burlingame, California, includes tracing electronics assembly issues using a Metris XT V real-time X-ray inspection system. This electronics X-ray inspection system allows quality engineers to intuitively navigate through the internal structure of assembled PCBs. In the rapidly evolving electronics industry, Mentzer Electronics uses the acquired insight to speed up and fi ne tune manufacturing processes. Real-time X-ray guarantees that no hidden defects remain in products when turning them out to customers nationwide.

Mentzer Electronics

Deep Learning Based Defect Detection for Solder Joints on Industrial X-Ray Circuit Board Images

Technical Library | 2021-05-06 13:41:55.0

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm.

Southeast University (SEU)

Comparing Costs and ROI of AOI and AXI

Technical Library | 2013-08-07 21:52:15.0

PCB architectures have continued their steep trend toward greater complexities and higher component densities. For quality control managers and test technicians, the consequence is significant. Their ability to electrically test these products is compounded with each new generation. Probe access to high density boards loaded with micro BGAs using a conventional in-circuit (bed-of-nails) test system is greatly reduced. The challenges and complexity of creating a comprehensive functional test program have all but assured that functional test will not fill the widening gap. This explains why sales of automated-optical and automated X-ray inspection (AOI and AXI) equipment have dramatically risen...

Teradyne

Benefits of Manual X-Ray Inspection for Medium-Sized EMS and OEM suppliers

Technical Library | 2023-11-20 17:42:33.0

Zero-defect strategies and increased demands on the production of assemblies are making quality assurance in electronics production increasingly important. Continous miniaturization of components, ever higher packing densities and the associated hard-to-view assembly areas, as well as the increased use of components such as BGAs, QFNs and QFPs, pose a considerable challenge when it comes to high-precision quality control.

Viscom AG

Common Process Defect Identification of QFN Packages

Technical Library | 2019-07-23 22:33:47.0

The Quad Flat Pack No Leads (QFN) style of leadless packaging [also known as a Land Grid Array (LGA)] is rapidly increasing in us e for wireless, automotive, telecom and many other areas becaus e of its low cost, low stand-off height and excellent thermal and electri cal properties. With the implementation of any new package type, there is always a learning curve for its use in design and processing as well as for the Process and Quality Engineers who have to get to grips with the challenges that these packages bring. Therefore, this paper will provide examples of the common process defects that can be seen with QFNs /LGAs when using optical and x-ray inspection as part of manufacturing quality control. Results of trials conducted on four PCB finishes and using vapour phase and convection reflow will be discussed.

Nordson DAGE

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