Technical Library | 2023-08-02 18:18:23.0
As six sigma (6) and better processes are demanded for higher yields and as organizations move from measuring defects in terms of parts-per-million (ppm) towards parts-per-billion (ppb), the resolution of extant control charts is becoming insufficient to monitor process quality. This work describes the development of a new statistical process control (SPC) chart that is used to monitor processes in terms of defects-per-billion-opportunities (dpbo). A logical extension of the defects-per-million-opportunities (dpmo) control chart, calculations used to derive the dpbo control limits will be presented and examples of in-control and out-of-control processes will be offered.
Technical Library | 2006-12-04 16:38:18.0
This paper will explore how test can be an integral part of manufacturing to assure High Reliability Products. We will discuss how test parameters and test techniques are effective in finding time zero vs. time dependent defects. Understanding of manufacturing processes in terms defect levels as well as defect types is very critical in defining test parameters, new test techniques and test alternatives. This ultimately can improve the yield, quality, and reliability. We will discuss the types of defects, time zero vs. time dependent defects, test parameters and effectiveness and new test techniques to find time dependent defects.
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