Used SMT Equipment | In-Circuit Testers
Agilent N5230C The PNA-L is designed for your general-purpose network analysis needs and priced for your budget. Intuitive Operation Simplifies and Speeds Measurements The PNA-L offers a 8.4 inch touch screen, simple interface with pull down
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight N5230C The PNA-L is designed for your general-purpose network analysis needs and priced for your budget. Intuitive Operation Simplifies and Speeds Measurements The PNA-L offers a 8.4 inch touch screen, simple interface with p
Used SMT Equipment | In-Circuit Testers
The E5071C network analyzer offers the highest RF performance and fastest speed in its class, with a wide frequency range and versatile functions. The E5071C is the ideal solution for manufacturing and R&D engineers evaluating RF components and circu
Used SMT Equipment | General Purpose Test & Measurement
Laser Source 310/1550 nm, 2-port, SC-PC Connectors The Exfo FLS-130A Laser Source gives you high dynamic range when working with a system that uses a laser transmitter. Model FLS-135A of the FLS-130A series includes the dual-wavelength 1310/1550 nm,
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
