Used SMT Equipment: backlight (Page 1 of 1)

Samsung Hanwha SM485 SMT Pick and Place Machine

Samsung Hanwha SM485 SMT Pick and Place Machine

Used SMT Equipment | Pick and Place/Feeders

5 nozzles (4+1) in 1 gantry   Force control head   Gripper nozzle   Backlight and laser lighting   All in one solution   High Speed for Chips + High Flexibility for Odd Shaped Component   Provides an optimum solution for insertion of components   App

QYSMT SOLUTION USA LLC / Qinyi Electronics Co.,Ltd

Juki JX-100 LED Compact High Speed

Juki JX-100 LED Compact High Speed

Used SMT Equipment | Pick and Place/Feeders

Compact High Speed Mounter for LED placement at low cost. Compact but with 800×360 mm long board size capacity, the JX-100 LED is a low cost placement solution for notebook PCs, LCD monitors, and a wide variety of lighting equipment. Superior

KingFei SMT Tech

Juki JX-350 Mounter

Juki JX-350 Mounter

Used SMT Equipment | Pick and Place/Feeders

JUKI high-speed Mounter machine. suitable for LED and large LCD backlight production.           JUKI High Speed Mounter JX-350 Features:        Chip Components: 32,000 CPH (Optimum Conditions)&n

KingFei SMT Tech

Ersa Ersascope 2 XL

Ersa Ersascope 2 XL

Used SMT Equipment | Visual Inspection

ERSASCOPE 2 XL * High-end endoscope inspection system *6 Movement axes for flexible adjustment to practically every required viewing angle *Includes 3 assorted exchangable optical inspection heads * High-performance, dimmable LED lighting in d

SMT Surplus, LLC

Aeroflex ATC-601

Aeroflex ATC-601

Used SMT Equipment | In-Circuit Testers

Aeroflex IFR ATC-601 Transponder Ramp Test Set IFR is a leader in the design, manufacture and marketing of Avionics test systems. The ATC-601 performs the ATC transponder test required by the revised Federal Aviation Regulations (91.172 and P

Test Equipment Connection

Rohde & Schwarz NRVD

Rohde & Schwarz NRVD

Used SMT Equipment | In-Circuit Testers

Rohde & Schwarz NRVD Dual Channel Power Meter NRVD functions like two independent NRVS power meters in one enclosure performing simultaneous measurements and exchanging data with each other. The two channels can be set separately so that two co

Test Equipment Connection

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