Used SMT Equipment: defect code list (Page 1 of 3)

Agilent Agilent E8257D-520-1E1

Agilent Agilent E8257D-520-1E1

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521.     Industry’s best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation     AM, FM, øM, pulse, and scan     Typical 6 ns rise/fall times and 20 ns pulse width     Dua

Test Equipment Connection

Agilent Agilent E8257D-520-1E1

Agilent Agilent E8257D-520-1E1

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521.     Industry’s best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation     AM, FM, øM, pulse, and scan     Typical 6 ns rise/fall times and 20 ns pulse width     Dua

Test Equipment Connection

Rohde & Schwarz SMJ100A-B11-B13-B103

Rohde & Schwarz SMJ100A-B11-B13-B103

Used SMT Equipment | In-Circuit Testers

10 MHz carrier offset, 1 Hz measurement bandwidth)     Excellent ACLR performance of typ. +69 dB for 3GPP FDD (test model 1, 64 DPCHs)     High-stability reference oscillator as standard     High level repeatability Ideal for production     Ve

Test Equipment Connection

Agilent E8257D-520-1E1

Agilent E8257D-520-1E1

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521.     Industry’s best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation     AM, FM, øM, pulse, and scan     Typical 6 ns rise/fall times and 20 ns pulse width     Dua

Test Equipment Connection

Agilent E8257D-520

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521.     Industry's best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation     AM, FM, 0M, pulse, and scan     Typical 6 ns rise/fall times and 20 ns pulse width     Dua

Test Equipment Connection

Agilent E8257D-520

Agilent E8257D-520

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521. Industry's best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation AM, FM, 0M, pulse, and scan Typical 6 ns rise/fall times and 20 ns pulse width Dual internal functio

Test Equipment Connection

Rohde & Schwarz SMJ100A

Rohde & Schwarz SMJ100A

Used SMT Equipment | In-Circuit Testers

10 MHz carrier offset, 1 Hz measurement bandwidth) Excellent ACLR performance of typ. +69 dB for 3GPP FDD (test model 1, 64 DPCHs) High-stability reference oscillator as standard High level repeatability Ideal for production Very short frequency

Test Equipment Connection

Agilent E8257D-520

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521. Industry's best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation AM, FM, 0M, pulse, and scan Typical 6 ns rise/fall times and 20 ns pulse width Dual internal functio

Test Equipment Connection

Agilent E8257D-520

Agilent E8257D-520

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521. Industry's best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation AM, FM, 0M, pulse, and scan Typical 6 ns rise/fall times and 20 ns pulse width Dual internal functio

Test Equipment Connection

Anritsu MT8212B

Anritsu MT8212B

Used SMT Equipment | In-Circuit Testers

Anritsu MT8212B-25-31 Cell Master Handheld Cable, Antenna and Base Station Analyzer Cell Master MT8212B is the value choice for deploying, maintaining and troubleshooting wireless base stations. Compact, handheld and lightweight, it combines th

Test Equipment Connection

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