Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
