Used SMT Equipment | In-Circuit Testers
Agilent W1314A The W1314A RF receiver is an integral part of the Agilent drive-test system. With easy configuration and robust connections, you can get quick and accurate measurements from the receiver when it is combined with the Agilent E6474A
Used SMT Equipment | In-Circuit Testers
Agilent 8757D The Agilent 8757D scalar network analyzer allows you to measure insertion loss, gain, return loss, SWR, and power quickly and accurately . With high-performance detectors and directional bridges, and a companion Agilent source and pr
Used SMT Equipment | In-Circuit Testers
Agilent 8757D The Agilent 8757D scalar network analyzer allows you to measure insertion loss, gain, return loss, SWR, and power quickly and accurately . With high-performance detectors and directional bridges, and a companion Agilent source and p
Used SMT Equipment | In-Circuit Testers
15GHz High Laser Input power: 10dBm (18dBm - Safe Input level) Built-in HeNe laser wavelength standard Benefits: The wavelength accuracy gives you the certainty of accurate channel characterization in dense WDM systems, to detect ch
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight 8757D The Agilent 8757D scalar network analyzer allows you to measure insertion loss, gain, return loss, SWR, and power quickly and accurately . With high-performance detectors and directional bridges, and a companion Agilent sou
Used SMT Equipment | In-Circuit Testers
Fujikura FSM-40PM To keep up with the development of DWDM optical communication devices, we developed the FSM40PM for splicing of PM fibers. The FSM-40PM splices dissimilar fiber combinations, especially Erbium-doped fiber to single-mode fiber us
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight 8757D Base Frequency: 50 GHz Max Frequency: 110 GHz The Agilent 8757D scalar network analyzer allows you to measure insertion loss, gain, return loss, SWR, and power quickly and accurately . With high-performance detectors and di
Used SMT Equipment | In-Circuit Testers
SPEA 4040 Flying Probe with Boundry Scan Model: FP 4040 HI-LINE SERIES 5 Flying Probe Tester Year: 2004 S/N: SWE537FF 4040 Hi Line; high speed high accuracy (1) DRIV-10 V/I Generator; Precision Driver, 4Q, +/-10V, +/- 1A (1) Boost-80 V/I Gene
Used SMT Equipment | In-Circuit Testers
Gigatronics GT-1000A Overview The new Giga-tronics GT-1000A Microwave Power Amplifier offers linear high-power amplification across multioctive bandwidths. Ideal for testing in EMC, wireless communications applications, and Defense EW systems.
Used SMT Equipment | In-Circuit Testers
Tektronix TLA7012-18 The TLA7000 Series mainframes can be used as either master or expansion mainframes (TL708EX 8-port Instrument Hub and Expander is required for 3-8 mainframes connected together using TekLink™ cable) TLA7012: Up to eight TL
