7 pcb ict stress tests results

Used SMT Equipment: pcb ict stress tests (Page 1 of 1)

Test Research (TRI) TR5001

• Modular upgrade options from MDA to ICT and functional test • High fault coverage test solution • Limited access solution and functional test expansion using PXI modules • Friendly UI with fast and easy program development.

SMTUNION

Test Research (TRI) TR5001E

Used SMT Equipment | In-Circuit Testers

Fealures • Modular upgrade options from MDA to ICT and functional test • High fault coverage test solution • Limited access solution and functional test expansion using PXI modules • Friendly UI with fast and easy program development Tester Sp

SMTUNION

SPEA 4060 Flying Probe Tester

Used SMT Equipment | AOI / Automated Optical Inspection

SPEA 4060 Starter SL Flying Probe Tester 4 top side probes SL - Shuttle Board Loader Year of manufacture 2013 Excellent conditions, as new CE certification Test area 500x400 mm, Top side High and Very High speed motorisation Software Leonard

ELMOTEK SRL

SPEA 4060 Starter SL

Used SMT Equipment | AOI / Automated Optical Inspection

SPEA 4060 Starter Flying Probe Tester 4 top side probes Year of manufacture 2013 Excellent conditions, as new CE certification Test area 500 x 400 mm Shuttle Board Loading High and Very High speed motorisation Softwar

ELMOTEK SRL

chimall UNG-117C PCB NG/OK Unloader

Used SMT Equipment | General Purpose Equipment

Apply The PCB NG/OK Unloader is connected to the back of AOI and has horizontal movement and go-through functions. The OK and NG PCB after being tested by AOI can be separated and sent to the PCB racks, so that the PCB can be protected better.

chimallsmt

Panasonic Panasonic chip mounter CM202

Used SMT Equipment | Pick and Place/Feeders

=1.0 ±50/Chip Cpk>=1.0 ±35/QFP Cpk>=1.0 ±50/Chip Cpk >=1.0 ±35/QFP Cpk >=1.0 Productive Highest Tact (CPH/sec) 25,000/0.144 19,000/0.189 7,200/0.5 Effectiveness Tact (CPH/sec) 17,000/0.21 14,000/0.26 5,000/0.72 PCB trans

Shenzhen Langke Automation Equipment Co.,Ltd

SPEA FP 4040 HI-LINE SERIES 5 Flying Probe Tester (2004)

Used SMT Equipment | In-Circuit Testers

SPEA 4040 Flying Probe with Boundry Scan Model: FP 4040 HI-LINE SERIES 5 Flying Probe Tester Year: 2004 S/N: SWE537FF 4040 Hi Line; high speed high accuracy (1) DRIV-10 V/I Generator; Precision Driver, 4Q, +/-10V, +/- 1A (1) Boost-80 V/I Gene

Tekmart International Inc.