Used SMT Equipment: sub-assembly (Page 1 of 1)

Conceptronics Freedom 3000

Conceptronics Freedom 3000

Used SMT Equipment | Repair/Rework

The Conceptronic Freedom 3000 printed circuit board repair station is designed for component rework, low volume prototype reflow soldering and process development. The Freedom 3000 machine structure is accurate, rigid, and stable in order to repeated

Capital Equipment Exchange

Fluke 54200-M01

Fluke 54200-M01

Used SMT Equipment | In-Circuit Testers

Fluke 54200-M01 The Fluke 54200 TV Signal Generator offers sound test signals and a highly stable RF output, making it ideal for complete testing of TV sets, VCRs or other related equipment. The Fluke 54200 offers single or multiple TV standards

Test Equipment Connection

JDSU OAB-1560

JDSU OAB-1560

Used SMT Equipment | In-Circuit Testers

JDSU OAB-1560 Optical Erbium-Doped Amplifier JDS Uniphase erbium-doped fiber amplifiers (EDFAs) amplify optical signals across the EDFA window (1528-1610 nm). Through optimization of amplifier gain, noise figure, and saturated output power, the

Test Equipment Connection

JDSU OAB-1560

JDSU OAB-1560

Used SMT Equipment | In-Circuit Testers

JDSU OAB-1560 Optical Erbium-Doped Amplifier JDS Uniphase erbium-doped fiber amplifiers (EDFAs) amplify optical signals across the EDFA window (1528-1610 nm). Through optimization of amplifier gain, noise figure, and saturated output power, the

Test Equipment Connection

Agilent 71612B

Agilent 71612B

Used SMT Equipment | In-Circuit Testers

Agilent 71612B-UHF Digital Transmission Tester 12Gb/s The 71612B error performance analyzer addresses applications for high speed digital testing up to 12 Gb/s, including R&D and manufacturing test of lightwave components and sub-assemblies, ad

Test Equipment Connection

Japan Radio Company OAB-1560

Japan Radio Company OAB-1560

Used SMT Equipment | General Purpose Test & Measurement

JDSU OAB-1560 Optical Erbium-Doped Amplifier JDS Uniphase erbium-doped fiber amplifiers (EDFAs) amplify optical signals across the EDFA window (1528-1610 nm). Through optimization of amplifier gain, noise figure, and saturated output power, the

Test Equipment Connection

Agilent 71612B-UHF

Agilent 71612B-UHF

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight 71612B-UHF Digital Transmission Tester 12Gb/s The 71612B error performance analyzer addresses applications for high speed digital testing up to 12 Gb/s, including R&D and manufacturing test of lightwave components and sub-assem

Test Equipment Connection

Agilent 71612B-UHF

Agilent 71612B-UHF

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight 71612B-UHF Digital Transmission Tester 12Gb/s The 71612B error performance analyzer addresses applications for high speed digital testing up to 12 Gb/s, including R&D and manufacturing test of lightwave components and sub-assem

Test Equipment Connection

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