Used SMT Equipment | In-Circuit Testers
Anritsu S810A Details Anritsu S810A 10 GHz Sitemaster Cable and Antenna Analyzer The Site Master S810A instruments are the most accurate, reliable and convenient one port microwave transmission line and antenna analyzers available for instal
Used SMT Equipment | In-Circuit Testers
HP-Agilent 54112D Digital Oscilloscopes Agilent 54112D Model: 54112D Manufactured by: Agilent Bandwidth: 100.0 MHz Channels: 4 See all Agilent equipment Agilent 54112D datasheet & specifications Agilent 5411
Used SMT Equipment | General Purpose Test & Measurement
The 8922S is a stand-alone GSM mobile station test set tailored to the demanding needs of incoming inspection and mobile repair. It includes a GSM base station emulator and all the signalling capability to fully test a mobile without additional equip
Used SMT Equipment | In-Circuit Testers
Agilent E8363B PNA Microwave Network Analyzer Agilent/HP E8363B PNA Microwave Network Analyzer, 10 MHz to 40 GHz Rapid and continuous changes in microwave and millimeter-wave technology present a growing challenge for designers and manufactur
Used SMT Equipment | General Purpose Test & Measurement
Tektronix TDS5104B Bandwidth: 1 Ghz Channels: 4 1 GHz, 5 GS/s, 4 Channel Digital Phosphor Oscilloscope The Tektronix TDS5104B oscilloscope is a graph-displaying device - it draws a graph of an electrical signal. In most applications, the graph s
Used SMT Equipment | In-Circuit Testers
Agilent 8753ES Agilent 8753ES 30 Khz to 3 or 6 Ghz Vector Network Analyzer The Agilent 8753ES vector network analyzer allows complete characterization of RF components. The 8753ES includes an integrated synthesized source, test set and tuned r
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight 8753ES Agilent 8753ES 30 Khz to 3 or 6 Ghz Vector Network Analyzer The Agilent 8753ES vector network analyzer allows complete characterization of RF components. The 8753ES includes an integrated synthesized source, test set an
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
