Industry News: 008004 0201m (Page 1 of 1)

Koh Young Technology Highlighting Expanded Inspection Capabilities at APEX 2019

Industry News | 2019-01-15 10:01:12.0

Seoul, South Korea – As ‘Your Partner for Smart Factory Realization,’ Koh Young Technology will show how its true 3D solutions can improve production throughput and yield at the IPC APEX Expo during 29-31 January 2019 in San Diego, California. This year, Koh Young will display an array of new inspection systems with expanded capabilities at Booth 1908 in the San Diego Convention Center.

Koh Young America, Inc.

Koh Young Technology highlighted the versatile Meister system at Semicon Taiwan

Industry News | 2018-09-18 02:49:24.0

Seoul, South Korea – Koh Young Technology, the pioneer and leader in 3D inspection technology, showed the latest Meister-D for the SiP (System-in-Package) assembly process. This innovative technology was recently highlighted at SEMICON Taiwan in the Taipei Nangang Exhibition Center.

Koh Young America, Inc.

Koh Young Launches the Meister D+ for Semiconductor Package Inspection to the Americas Market

Industry News | 2021-10-11 08:08:21.0

Koh Young, the industry leader in True3D™ measurement-based inspection solutions, announces the release of its new Meister D+ semiconductor inspection solution. Premium True3D™ Inspection Solution for Chiplets and System-in-Package (SiP) devices including die and surface mount components. The new Meister D+ is an extension of the Meister product family that features solutions ranging from solder paste, printed bumps, and solder ball to small components like 0201Ms and highly reflective die.

Koh Young America, Inc.

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