Industry News | 2019-03-10 20:30:11.0
The proliferation of tighter microvia densities and signal integrity requirements in printed boards within the electronics industry has revealed reliability concerns with microvia structures in high performance products. A number of IPC OEM member companies have approached IPC with examples of microvia failures in high-profile hardware that were not observed until after bare printed board fabrication, inspection and acceptance, including:
Industry News | 2020-10-04 16:19:24.0
IPC Releases PCB Industry Results for August 2020
Industry News | 2021-01-30 07:13:13.0
IPC Releases EMS Industry Results for December 2020
Industry News | 2010-04-27 10:34:23.0
BANNOCKBURN, Ill., USA — IPC — Association Connecting Electronics Industries® announced today the March findings from its monthly North American Printed Circuit Board (PCB) Statistical Program.
Industry News | 2010-05-30 16:23:14.0
BANNOCKBURN, Ill., USA — IPC — Association Connecting Electronics Industries® announced today the April findings from its monthly North American Printed Circuit Board (PCB) Statistical Program.
Industry News | 2011-03-31 12:37:40.0
IPC — Association Connecting Electronics Industries® announced today the February findings from its monthly North American Printed Circuit Board (PCB) Statistical Program.
Industry News | 2011-12-01 13:37:50.0
IPC announced the October findings from its monthly North American Printed Circuit Board (PCB) Statistical Program.
Industry News | 2012-03-30 14:42:30.0
— IPC — Association Connecting Electronics Industries® announced today the February findings from its monthly North American Printed Circuit Board (PCB) Statistical Program.
Industry News | 2013-02-20 18:54:10.0
IPC — Association Connecting Electronics Industries® presented Committee Leadership, Distinguished Committee Service and Special Recognition Awards at IPC APEX EXPO® at the San Diego Convention Center.
Industry News | 2018-12-21 15:12:38.0
The GL Spectis 1.0 Touch Flicker Spectrometer is ideal for categorizing flicker in luminaire design and test, in addition to full CIE photometric and radiometric parameter calculation, LED Binning, Pass/Fail testing, remote control and data transfer, etc.
