Industry News | 2003-06-10 08:16:44.0
The following text describes the application of NWA Quality Analyst to quality control in the assembly of electronic components.
Industry News | 2003-03-12 09:10:10.0
As part of the opening celebration, Teradyne will be exhibiting this week at SEMICON China and in April at Nepcon Shanghai.
Industry News | 2003-03-25 09:15:19.0
The Dragon was demonstrated at the CPCA show in Shanghai last week
Industry News | 2003-04-15 08:39:15.0
Granted supplier qualification by the United States Department of Defense's Defense Supply Center Columbus (DSCC)
Industry News | 2003-05-02 08:49:07.0
Group to Assemble Data by Package and Technology Type
Industry News | 2003-05-30 08:26:20.0
The inventors of this module type and holders of the patent are chief technical officer Kenneth J. Kledzik and president Jason C. Engle, both of San Clemente, California.
Industry News | 2008-03-25 23:53:54.0
Comment from Brian D�Amico, President
Industry News | 2009-07-12 14:19:25.0
Seoul Korea — July 2009 — MIRTEC, “The Global Leader in Inspection Technology,” announces that the company has been awarded contracts totaling more than $15M with leading mobile solution manufacturers for its MV-7xi inline automated optical inspection (AOI) systems.
Industry News | 2010-11-03 01:06:42.0
MIRTEC announces that it has been awarded a 2010 Global Technology Award in the category of AOI Inspection Systems for its MV-7xi In-Line AOI System configured with MIRTEC’s exclusive 15M Pixel ISIS Vision System.
