Industry News: aoi escape (Page 1 of 6)

NEMI's Test Strategy Project Releases Cost Model

Industry News | 2003-05-22 08:54:17.0

Allows PCA Manufacturers to Compare Costs of Alternative Test Strategies

SMTnet

Kester’s Peter Biocca to Chair AOI and X-Ray Inspection Technical Session at SMTAI 2010

Industry News | 2010-10-04 17:03:39.0

Kester announces that Peter Biocca, Senior Market Development Engineer, will Co-Chair Session PRC2, titled “Strategies for Optimizing AOI and X-Ray Inspection” at the upcoming SMTA International, scheduled to take place October 24 - 28, 2010 at the Walt Disney World Swan and Dolphin Resort in Orlando, FL. The session will take place Wednesday, October 27, 2010 from 10:30 a.m.-12 p.m. in room Europe 1.

Kester

Saki Presents "From Inspection to Measurement" at Productronica, Stand A2.239

Industry News | 2015-11-04 20:05:54.0

Saki Corporation announces that its new 3D automated optical inspection, solder paste, and x-ray technology and equipment will be demonstrated at Productronica 2015, in Stand A2.239, as part of the theme "From Inspection to Measurement."

SAKI America

TRI presents New High-Reliability 3D AOI Solution

Industry News | 2021-01-11 15:33:48.0

Test Research, Inc. (TRI) is pleased to announce the release of the high-reliability TR77000QM SII3D AOI.

TRI - Test Research, Inc. USA

Saki Demonstrates XL 3D AOI System and On-the-Fly Debugging Software at SMTA International Booth 726

Industry News | 2016-09-22 18:12:16.0

Saki Corporation will demonstrate its BF-3Di-Z1 3D AOI system for extra-large (686x870mm) PCBs and easy-to-program real-time software in booth 726 at SMTA International, September 27 and 28th, 2016, being held at the Donald Stephens Convention Center, Rosemont, IL. Saki's 3D AOI systems measure heights from 0-20mm with 1µm resolution, measure the surface of surface mount devices and through-hole packages from all four directions without a dead angle or shadowing, and achieve full automation with very low false calls and zero escapes.

SAKI America

New 3D AOI from TRI at SMTAI 2022

Industry News | 2022-09-30 10:56:11.0

Test Research, Inc. (TRI) is joining the upcoming SMTA International Exhibition on November 2nd – 3rd, 2022, at the Minneapolis Convention Center. Visit booth No. 1030 to join TRI on the road to zero escapes and experience cutting-edge PCBA test and inspection for the electronics manufacturing industry.

TRI - Test Research, Inc. USA

CyberOptics Wins a 2008 EMAsia Innovation Award for Its High-Performance AOI System

Industry News | 2008-04-09 14:26:39.0

MINNEAPOLIS - April 2008 - CyberOptics Corporation (Nasdaq: CYBE) announces that it has been awarded an EMAsia Innovation Award in the category of Inspection Equipment � AOI for its Flex HR (High Resolution) AOI system. The award was presented to the company during an April 9, 2008 ceremony that took place at The Foyer outside the Grand Ballroom of the Shanghai Everbright International Hotel during Nepcon China 2008.

CyberOptics Corporation

CyberOptics� High-Performance AOI System Wins a 2008 SMT China Vision Award

Industry News | 2008-05-03 15:36:30.0

MINNEAPOLIS - May 2008 - CyberOptics Corporation (Nasdaq: CYBE) announces that it has been awarded an EMAsia Innovation Award in the category of Inspection & Testing � AOI for its Flex HR (High Resolution) AOI system. The award was presented to the company during an April 8, 2008 ceremony that took place at the Shanghai Everbright Convention & Exhibition International Hotel during NEPCON China/EMT China.

CyberOptics Corporation

CyberOptics to Showcase the New SQ3000 3D AOI at SMTAI

Industry News | 2015-08-27 19:13:11.0

CyberOptics® Corporation (NASDAQ: CYBE) today announced that it will exhibit in Booth #814 at SMTA International, scheduled to take place Sep. 29 - 30, 2015 at the Donald Stephens Convention Center in Rosemont, IL. Company representatives will showcase CyberOptics’ newly launched SQ3000™ 3D AOI system.

CyberOptics Corporation

CyberOptics to Exhibit High-Performance AOI at APEX 2008

Industry News | 2008-03-04 12:10:09.0

MINNEAPOLIS - January 8, 2008 - CyberOptics Corporation (Nasdaq: CYBE) announces that it will showcase its Flex Ultra High-Resolution automated optical inspection system (AOI) in booth 611 at the upcoming APEX 2008 exhibition and conference, scheduled to take place April 1-3, 2008, in Las Vegas.

CyberOptics Corporation

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