Industry News | 2023-08-29 07:34:07.0
Nordson TEST & INSPECTION today announced its participation in SEMICON Taiwan, one of the most anticipated events in the semiconductor industry. The company will be showcasing its state-of-the-art inspection and metrology solutions, including the CyberOptics SQ3000™+ Multi-Function system, the new Quadra 7 Pro Manual X-ray Inspection (MXI) System, and the revolutionary WaferSense® Auto Teaching System™ (ATS2). The event will take place from Sept. 6-8, 2023 at TaiNEX 1&2 in Taipei.
Industry News | 2012-05-09 15:50:19.0
CyberOptics Semiconductor (www.CyberOpticsSemi.com) will discuss the tool qualification features of its WaferSense® Airborne Particle Sensor (APS) as it is used to measure the presence and density of airborne particles inside fab tools during Semicon West
Industry News | 2017-04-10 12:45:21.0
Hanwha Techwin Automation Americas today announced record SMT machine systems sales of component mounters and turnkey SMT assembly line solutions in North America for Q1 of 2017.
Industry News | 2022-09-05 06:50:46.0
The company will also unveil new WaferSense® and ReticleSense® Auto Teach Systems™ (ATS2™ and ATSR™)
Industry News | 2018-02-19 13:38:21.0
CyberOptics® Corporation announces it will demonstrate its ReticleSense® Auto Multi Sensors – the world’s most efficient and effective wireless measurement devices for semiconductor fabs and equipment OEMs at SPIE Advanced Lithography at the San Jose Convention Center, February 27-28th at booth #314.
Industry News | 2016-06-28 15:39:59.0
Advanced APS2 measurement technology incorporates a wider range of particle sizes CyberOptics’ Auto Multi Sensors Named “Best of West” Finalist for SEMICON 2016 by SEMI and Solid State Technology
Industry News | 2017-06-07 12:11:56.0
CyberOptics® Corporation will demonstrate the WaferSense and ReticleSense Auto Multi Sensors (AMS/AMSR) at SEMICON West July 11-13 at the Moscone Center in San Francisco, California in booth #6562.
Industry News | 2016-08-17 20:34:31.0
CyberOptics® Corporation announces it will showcase its next-generation Airborne Particle Sensor technology (APS2), that incorporates large particle sensing capability. Both the WaferSense® and ReticleSense® Airborne Particle Sensors (APS2, APSR and APSRQ) can measure both small and large particles. The new large particle detecting and measurement functionality covers a range of sizes with four bins for particles larger than 2, 5, 10 and 30 microns. Products will be on display at the upcoming SEMICON Taiwan in Taipei, September 7-9, 2016 in booth #200, 4th floor.
Industry News | 2016-11-24 19:49:30.0
CyberOptics® Corporation announces it will showcase its next-generation Airborne Particle Sensor technology (APS2) with an extended particle size range at the upcoming SEMICON Japan in Tokyo, December 14-16, 2016 in booth #4605.
Industry News | 2017-02-07 15:58:12.0
CyberOptics® announces it will demonstrate its next-generation Airborne Particle Sensor technology (APS2) with an extended particle size range at SEMICON Korea, February 8-10th at the COEX in Seoul, Booth # 2220.
