Industry News: bead probe (Page 1 of 1)

PCB Test Point Provide Easy Component Access

Industry News | 2003-06-13 09:56:46.0

Wire and spring specialist William Hughes can now offer three different versions of its PCB test point - small, large and long-legged in quantities suitable for prototype work or volume production.

SMTnet

ECT’s CPG To Feature Leading Electrical Test Technologies At APEX 2010

Industry News | 2010-03-22 14:33:44.0

Pomona, CA, March 2010 — Everett Charles Technologies (ECT) Contact Products Group (CPG) will feature the latest electrical test technologies in booth 1283 at the upcoming IPC/APEX conference and exhibition, scheduled to take place April 6-8, 2010 at the Mandalay Bay Resort & Convention Center in Las Vegas.

Everett Charles Technologies (acquired by LTX-Credence, which was acquired by Cohu)

Agilent Technologies to Release Boundary Scan-VTEP Hybrid that Minimizes Obstacles to In-Circuit Test

Industry News | 2008-02-19 10:31:21.0

Agilent Technologies Inc. (NYSE: A) today announced that it will offer in-circuit test (ICT) users an innovative way to test their printed circuit board assemblies (PCBAs) in a limited access environment without sacrificing test coverage or time-to-market -- while simultaneously saving on fixture cost and reducing test resources.

Agilent Technologies, Inc.

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