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Saki Debuts 3rd Generation 3D AOI Inspection Systems at NEPCON Japan Booth E17-46

Industry News | 2016-01-11 09:28:35.0

Saki also demonstrates 3D automated X-ray inspection and measurement systems.

SAKI America

Saki Demonstrates 3D AOI Systems at NEPCON South China Booth 1G35

Industry News | 2016-08-28 13:28:32.0

Saki Corporation will demonstrate its 2D and 3D automated optical inspection (AOI) systems at NEPCON South China in booth 1G35. Saki's AOI systems' unique Phase Measurement Profilometry technology and quad-directional side cameras inspect and measure QFNs, J-leads, and connectors, and enable the detection of the most difficult defects, such as lifted leads, tombstones, reverses, and height variations, without a reduction in speed. NEPCON South China is being held August 30-September 1, 2016 at the Shenzhen Convention & Exhibition Center, Shenzhen, China.

SAKI America

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