Industry News: chemical calibration for ionograph (Page 1 of 1)

Agilent Technologies Introduces Highly Sensitive Imaging Mode for Complex, Calibrated Electrical and Spatial Measurements

Industry News | 2008-07-19 12:33:16.0

Agilent Technologies Inc. (NYSE: A) today announced the availability of scanning microwave microscopy (SMM) mode, a unique imaging technique that combines the comprehensive electrical measurement capabilities of a performance network analyzer (PNA) with the outstanding spatial resolution of an atomic force microscope (AFM).

Agilent Technologies, Inc.

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