Industry News | 2023-01-30 16:56:37.0
For the first time, Heraeus Electronics will exhibit at SEMICON Korea, scheduled to take place February 1-3, 2023, at COEX in Seoul, Korea. At the exhibition, Heraeus Electronics will show a wide range of innovative materials to enhance power modules and semiconductor device performance.
Industry News | 2019-11-05 22:23:45.0
The basic principle of a press-fit connection is that a contact terminal is pressed into a printed circuit board (PCB). There are two types of press-fit pins – the solid pin with a solid press-in zone and the compliant pin with an elastic press-in zone. In this article, we’ll discuss the elastic press-in zone.
Industry News | 2003-06-11 13:37:07.0
With efficiencies better or comparable to competing implementations in the MLF/QFN/Power Block packages, these new devices in the LITTLE FOOT SO 16 feature a 38% or smaller standard footprint, simplifying design, assembly, soldering, and layout.
Industry News | 2009-04-02 09:23:02.0
Economic woes � Chinese companies vie for increased sales
Industry News | 2014-04-01 20:01:42.0
ADLINK Technology announced release of the new Extreme Rugged™ HPERC-IBR system. The HPERC™ (High Performance Extreme Rugged Computer) Series offers a compact, highly reliable and efficient processing unit to meet challenging SWaP (Size, Weight and Power) requirements for modern ground and aerial vehicle applications. HPERC offers one of the first product implementations of the VITA-75 standard to address commercial off-the-shelf (COTS) requirements for Unmanned Ground Vehicle (UGV) applications.
Industry News | 2018-10-09 18:44:45.0
Nordson DAGE announces the launch of Quadra® W8, a versatile lab-based solution for wafer-level inspection offering industry-leading magnification and image quality. Integrated dual port EFEM provides complete wafer protection by removing any manual wafer handling so operators can inspect wafer level quality directly from the FOUP.
Industry News | 2018-10-09 18:44:51.0
Nordson DAGE announces the launch of Quadra® W8, a versatile lab-based solution for wafer-level inspection offering industry-leading magnification and image quality. Integrated dual port EFEM provides complete wafer protection by removing any manual wafer handling so operators can inspect wafer level quality directly from the FOUP.
Industry News | 2023-03-28 10:11:20.0
XJTAG® announces a new release of its world-leading JTAG boundary scan tools. Creating boundary scan test projects is now even easier and quicker with XJTAG 3.13. An efficient way to deal with build variants, faster categorising of I2C devices, aided checking of net categorisations, adding images to dialogs.
Industry News | 2012-03-24 10:06:28.0
NEPCON China Becomes a Platform for the Debut of New Product Releases in Asia
Industry News | 2003-04-07 11:00:15.0
The innovative VPI-1000 optical inspection system is the only benchtop SMT inspection system capable of inspecting BGA devices as standard, without necessitating a lengthy lens reconfiguration.
