Industry News | 2003-04-15 08:57:18.0
First Implementation of the Package Platform Delivers 50-percent Cost, 60-percent Height, and 75-percent Area Reductions over Conventional RF Module Technologies
Industry News | 2021-01-21 08:00:10.0
Each year, IPC APEX EXPO features industry's most dynamic, innovative minds to deliver keynote presentations that are both educational and entertaining. IPC APEX EXPO 2021 will feature IndustryWeek Editor-in-Chief Travis Hessman. During his keynote on March 10, Hessman will present, "The Great Digital Transformation."
Industry News | 2013-09-11 10:43:09.0
LAPIS Semiconductor, a ROHM Group Company, has recently developed 8-bit microcontrollers equipped with an oscillator circuit that provides more than twice the accuracy compared with previous models.
Industry News | 2018-06-06 15:58:15.0
The SPD1168X supply is an economical, stable, reliable, single-channel power source with low ripple and noise (≤ 350 uV RMS/3mVpp;
Industry News | 2008-01-28 23:23:03.0
New Instrument Class Offers Most Accurate and Accelerated Insight into Devices and Designs, Enables Quantum Leap in Productivity
Industry News | 2008-03-20 13:10:39.0
Agilent Technologies Inc. (NYSE: A) today announced a new firmware release for its E5052B Signal Source Analyzer -- making it more convenient and flexible for use in phase-noise and jitter measurements.
Industry News | 2010-05-11 14:03:39.0
Rosenheim, - Multitest announces that SensorDynamics, a semi-fabless semiconductor company, is using Multitest equipment for MEMS test and calibration for the entire temperature range. SensorDynamics recently introduced its new 2- and 3-D gyroscope MEMS sensors for a range of applications, from automotive to medicine and high-end consumers.
Industry News | 2002-04-26 09:00:13.0
Licensing Its Echo and Noise Cancellation Technologies
Industry News | 2022-03-18 16:24:08.0
OR-01 OhmRanger-LCV™ has been designed as a portable instrument for measuring the resistance of delicate components by using a very low stimulus voltage to avoid damaging the device being tested.
Industry News | 2002-02-12 21:38:04.0
Tri-Contact� Test Connector
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