Industry News | 2020-07-07 13:48:00.0
CyberOptics® Corporation (NASDAQ: CYBE) announces that it was awarded a 2020 EM Asia Innovation Award in the category of Test Equipment-Testing Software Suite for its CyberCMM™. The award was presented to the company during a ceremony that took place July 3, 2020 at the National Exhibition and Convention Center in Shanghai.
Industry News | 2020-07-09 18:33:25.0
WX3000 Systems Incorporate Proprietary NanoResolution MRS™ Sensor Technology
Industry News | 2020-08-28 03:00:30.0
CyberOptics® Corporation (NASDAQ: CYBE) announces that it was awarded a 2020 SMT China Vision Award in the category of Software – Process Control for its CyberCMM™. The award was presented to the company during an Aug. 26, 2020 ceremony that took place during NEPCON Asia in Shenzhen.
Industry News | 2020-10-29 08:13:02.0
CyberOptics® Corporation (NASDAQ: CYBE) announces that it was awarded a 2020 Mexico Technology Award in the category of Software – Process Control for its CyberCMM™. The award was announced during a Virtual Award Ceremony that took place Monday, October 26, 2020.
Industry News | 2021-11-17 15:21:10.0
CyberOptics® Corporation (NASDAQ: CYBE) received a 2021 GLOBAL Technology Award in the category of Metrology for its WX3000™ Metrology and Inspection System. The award was announced during a ceremony that took place Tuesday, Nov. 16, 2021 at Productronica in Munich, Germany.
Industry News | 2023-10-12 20:54:48.0
Atlanta, Georgia – Koh Young Technology, the industry leader in True 3D measurement-based inspection solutions, will deliver live demonstrations of its award-winning inspection machines and smart factory software during the SMTA Guadalajara Expo and Tech Forum in Jalisco, Mexico on October 25-26, 2023. Additionally, Heriberto Cuevas, Regional Sales Manager for Mexico will take part in a roundtable about the application of artificial intelligence for automated optical inspection.
Industry News | 2020-09-06 04:37:56.0
CyberOptics® Corporation (NASDAQ: CYBE) will present at the SEMICON Taiwan Global SiP Summit on September 24, 2020 at 4:20pm. Tim Skunes, VP of R&D at CyberOptics, will share the technical presentation 'Fast, 100% 3D Wafer Bump Metrology and Inspection to Improve Yields and 3D System Integration'.
Industry News | 2020-11-18 15:38:26.0
CyberOptics® Corporation (NASDAQ: CYBE) will present at the Virtual IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE) on December 16th at 8:00amCT.
Industry News | 2021-10-11 08:08:21.0
Koh Young, the industry leader in True3D™ measurement-based inspection solutions, announces the release of its new Meister D+ semiconductor inspection solution. Premium True3D™ Inspection Solution for Chiplets and System-in-Package (SiP) devices including die and surface mount components. The new Meister D+ is an extension of the Meister product family that features solutions ranging from solder paste, printed bumps, and solder ball to small components like 0201Ms and highly reflective die.
Industry News | 2017-10-17 19:59:54.0
CyberOptics® Corporation will demonstrate the SQ3000™-DD 3D Automated Optical Inspection (AOI) system with the new Ultra-High Resolution Multiple-Reflection Suppression (MRS) Sensors in Hall A4, Stand 239 at productronica 2017, scheduled to take place Nov. 14 – 17, 2017 at the Messe München in Germany. The company also will unveil the new SE3000™ 3D SPI and SQ3000™ 3D CMM, both powered by MRS technology.
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