Industry News: cyber and optics (Page 19 of 71)

CyberOptics to Exhibit the QX100™ Tabletop System at the SMTA Penang Tabletop Expo

Industry News | 2012-10-16 08:42:41.0

CyberOptics Corporation (Nasdaq: CYBE) will highlight the QX100™ at the SMTA Penang Tabletop Exhibition, scheduled to take place November 16, 2012 in the Ball Room, table 17 at the Eastin Hotel Penang, Malaysia.

CyberOptics Corporation

CyberOptics Picks Up Three Awards at NEPCON China

Industry News | 2014-05-02 17:55:32.0

CyberOptics Corporation (Nasdaq: CYBE) announces that it has bagged three awards for its latest inspection systems and unique value-add program at NEPCON China 2014.

CyberOptics Corporation

CyberOptics Demonstrates Advanced Airborne Particle Sensing Technology at SEMICON West

Industry News | 2018-05-24 21:11:20.0

CyberOptics® Corporation announces plans to exhibit at SEMICON West, scheduled to take place July 10-12, 2018 at the Moscone Center in San Francisco, CA. The company will demonstrate its next-generation Airborne Particle Sensor (APS3) 300mm with new ParticleSpectrum™ software in Booth #6163.

CyberOptics Corporation

CyberOptics’ Newest, Most Advanced 3D SPI System Wins the 2013 EM Asia Innovation Award

Industry News | 2013-04-26 11:11:01.0

CyberOptics Corporation (Nasdaq: CYBE) announces that it has been awarded a 2013 EM Asia Innovation Award in the category of Test & Measurement/Inspection Systems – SPI for its SE600™ 3D SPI system.

CyberOptics Corporation

Nordson Test & Inspection to Demonstrate Best-in-Class Inspection and Metrology Systems at APEX 2023

Industry News | 2023-01-16 07:38:53.0

Nordson Test & Inspection today announced that it will exhibit at the 2023 IPC APEX EXPO, scheduled to take place Jan. 24-26, 2023 at the San Diego Convention Center in California. The company will highlight the multi-award-winning CyberOptics SQ3000™+ Multi-Function system for AOI, SPI and CMM, the M2 AOI system, the CyberOptics SE3000™ SPI system and Quadra 7 X-ray system in Booth #915.

Nordson Corporation

CyberOptics to Discuss Tool Qualification Capabilities of WaferSense® Airborne Particle Sensor at Semicon West 2012

Industry News | 2012-05-09 15:50:19.0

CyberOptics Semiconductor (www.CyberOpticsSemi.com) will discuss the tool qualification features of its WaferSense® Airborne Particle Sensor (APS) as it is used to measure the presence and density of airborne particles inside fab tools during Semicon West

CyberOptics Corporation

CyberOptics to Present '100% Wafer Bump Metrology and Inspection' Technical Paper at the SEMICON Taiwan SiP Global Summit 2020

Industry News | 2020-09-06 04:37:56.0

CyberOptics® Corporation (NASDAQ: CYBE) will present at the SEMICON Taiwan Global SiP Summit on September 24, 2020 at 4:20pm. Tim Skunes, VP of R&D at CyberOptics, will share the technical presentation 'Fast, 100% 3D Wafer Bump Metrology and Inspection to Improve Yields and 3D System Integration'.

CyberOptics Corporation

ASC International/CyberOptics to demonstrate SPI and AOI solutions at Toronto SMTA Expo

Industry News | 2014-05-13 18:08:42.0

ASC International will exhibit at the Toronto SMTA Expo & Tech Forum, scheduled to take place Thursday, May 15, 2014 at the Four Points by Sheraton Toronto Airport in Toronto, ON.

ASC International

CyberOptics to Present Technical Paper at SPIE Optics + Photonics 2020 On-Line Conference

Industry News | 2020-07-29 17:51:05.0

CyberOptics® Corporation (NASDAQ: CYBE) will present at the SPIE Optics and Photonics On-Line Conference on August 24 during the SPIE Optical Engineering and Applications Symposium's verification and alignment session from 8:20 to 10:00am.

CyberOptics Corporation

CyberOptics to Display Process Insight� at APEX 2008

Industry News | 2008-03-20 14:35:30.0

MINNEAPOLIS - March 2008 - CyberOptics Corporation (Nasdaq: CYBE) announced that it will feature Process Insight statistical process control (SPC) software in booth 2215 at the upcoming APEX 2008 exhibition and conference, scheduled to take place April 1-3, 2008, in Las Vegas.

CyberOptics Corporation


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