Industry News: defect analysis (Page 10 of 44)

NEPCON China 2008 - FINEVIEW� Asian Premiere

Industry News | 2008-04-07 21:12:39.0

FINETECH announces FINEVIEW� video microscope station will make its Asian premiere at the upcoming NEPCON China 2008 trade show and exhibition, scheduled to take place April 8 to 11, 2008, in Shanghai, China.

Finetech

VJ Electronix Opens New Customer Center in Southern China

Industry News | 2012-08-09 18:28:02.0

VJ Electronix, Inc. announces the opening of its new customer support and demonstration center in Shenzhen, China.

VJ Electronix

Seica SpA celebrates the opening of a new manufacturing department

Industry News | 2014-08-05 09:15:08.0

Seica has started a new business in a manufacturing facility nearby their Strambino head office.

SEICA SpA

Indium Corporation's Jason Chou to Present at SEMICON Taiwan

Industry News | 2023-09-04 13:36:25.0

Indium Corporation Senior Area Technical Manager Jason Chou will present at SEMICON Taiwan on September 7, in Taipei, Taiwan.

Indium Corporation

Aegis Software to Speak at InnovationsFORUM Hungary, Discuss Changes in the Manufacturing Landscape and Harnessing Data Analysis for Zero Defect Production

Industry News | 2017-04-26 11:45:36.0

Aegis today announced its participation at the upcoming InnovationsFORUM Hungary, to be held on May 25th at the Hungarian Academy of Science in Budapest.

Aegis Industrial Software Corporation

Manual X-ray inspection by Viscom, intelligently networked and with cobots

Industry News | 2018-11-14 15:43:26.0

Manual X-ray inspection (MXI) will remain an important part of quality assurance in electronics manufacturing in the future. Viscom AG will demonstrate at the electronica trade show in Munich from November 13-16 how sophisticated the operation of such a system is and how extensively it can already be networked today.

Viscom AG

Altus Provides Precision Inspection for Advanced Semiconductor Packaging

Industry News | 2023-10-30 12:14:11.0

Altus Group is enabling manufacturers to adopt advanced semiconductor packaging techniques with Koh Young's Meister D automated optical inspection (AOI) systems.

Altus Group

Verifer HR High-Resolution X-Ray Inspection Solution

Industry News | 2004-09-27 17:12:27.0

High-Resolution X-Ray Inspection Under $60K

MatriX Technologies GmbH

Preview for the print media for Seica Inc for the Nepcon Shanghai show, April 25th to 27th, booth 1H70

Industry News | 2012-03-30 18:18:57.0

Seica China will be an exhibitor at the Nepcon Shanghai being held on April 25th to 27th. The featured systems in booth # 1 H70 will include the Pilot V8 Flying Prober and the RTE-200 System.

SEICA SpA

HITACHI Solder Paste Printers, Koh Young SPI Systems Interface for ‘On-the-fly’ Print Process Optimization

Industry News | 2012-12-07 13:52:19.0

Hitachi high-speed, high performance solder paste printers and Koh Young Technology's 3D Solder Paste Inspection (SPI) systems can now "talk" to one another via Koh Young's award-winning Closed Loop Interface process control software. The process control software brings the SPI system and the printer together via a closed-loop communications link to not only identify defects in solder paste printing, but correct them at the printer.

Hitachi High Technologies America, Inc.


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