Industry News: dic (Page 1 of 2)

Akrometrix Announces Enhanced Digital Image Correlation (DIC) Module

Industry News | 2016-03-30 08:12:07.0

Akrometrix today introduced the latest generation Digital Image Correlation (DIC) module for both its AXP and PS200 platforms.

Akrometrix

JEDEC Announces Broad Spectrum of 3D-IC Standards Development

Industry News | 2011-03-21 13:35:30.0

JEDEC Solid State Technology Association announced a broad spectrum of ongoing standards development work related to 3D-ICs.

JEDEC Solid State Technology Association

Akrometrix Launches New Tabletop Shadow Moiré (TTSM) at SMTA International

Industry News | 2017-08-14 18:57:16.0

Akrometrix will display its newest warpage metrology system in Booth #124 at SMTA International, scheduled to take place Sept. 19-20, 2017 at the Donald Stephens Convention Center in Rosemont, IL. The new Tabletop Shadow Moiré (TTSM) system responds to the industry’s demand for an ultra-fast tabletop warpage metrology system.

Akrometrix

DEN-ON INSTRUMENTS, CO., LTD. to Show Its Rework Product Line at NEPCON Japan

Industry News | 2015-12-13 19:14:47.0

DEN-ON INSTRUMENTS, CO., LTD. is pleased to announce that it will exhibit in East Hall E1-1 at NEPCON Japan, scheduled to take place Jan. 13-15, 2016 at the Tokyo Big Site in Japan. DEN-ON will showcase its rework product line driven by the latest advances in PCB and component miniaturization technologies

DEN-ON INSTRUMENTS CO., LTD.

Akrometrix Announces Next-Generation AXP Shadow Moiré System

Industry News | 2016-10-04 19:28:47.0

Akrometrix today announced its next-generation Shadow Moiré System – the AXP 2.0.

Akrometrix

Akrometrix to Showcase Next-Generation AXP Shadow Moiré System at APEX

Industry News | 2017-01-10 10:51:05.0

Akrometrix will exhibit in Booth #704 at the 2017 IPC APEX EXPO, scheduled to take place Feb. 14-16, 2017 at the San Diego Convention Center in Calif. The company will demonstrate its next-generation Shadow Moiré System – the AXP 2.0.

Akrometrix

Akrometrix Wins a 2017 NPI Award for Its Next Generation AXP Shadow Moiré System at APEX

Industry News | 2017-02-15 15:15:39.0

Akrometrix is pleased to announce that it has been awarded a 2017 NPI Award in the category of First Article Inspection for the new AXP 2.0. The award was presented to the company during a Tuesday, Feb. 14, 2017 ceremony that took place at the San Diego Convention Center during the IPC APEX EXPO.

Akrometrix

Akrometrix Answers the Industry’s Demand for an Ultra-Fast Tabletop Warpage Metrology System Just in Time for productronica

Industry News | 2017-10-16 19:34:54.0

Akrometrix will display its newest warpage metrology system in Hall A3, Stand 102/1 at productronica 2017, scheduled to take place Nov. 14 – 17, 2017 at the Messe München, in Germany. The new Tabletop Shadow Moiré (TTSM) system offers all of the software features of Akrometrix’s thermal warpage metrology systems in a room temperature unit which provides full field-of-view measurement in less than two seconds.

Akrometrix

DEN-ON INSTRUMENTS, CO., LTD. Will Exhibit the 7th Model Series RD-500SV Rework Station at productronica

Industry News | 2015-10-21 17:32:37.0

DEN-ON INSTRUMENTS is pleased to announce that it will exhibit with Technisches Büro Kullik GmbH (TBK) in Hall A4, Booth 231 at the productronica International Trade Fair, scheduled to take place Nov. 10-13, 2015 at the Messe München exhibition center in Munich, Germany. TBK will showcase the 7th Model Series of DEN-ON INSTRUMENTS CO., LTD.’s RD-500SV Rework Station.

DEN-ON INSTRUMENTS CO., LTD.

DEN-ON INSTRUMENTS, CO., LTD. Appoints Distributor in Malaysia

Industry News | 2015-12-20 14:53:51.0

DEN-ON INSTRUMENTS is pleased to announce the appointment of SWK Venture Sdn bhd as its distributor in Malaysia. Located in Penang Malaysia, SWK supplies and provides technical services for production machinery and equipment such as PCB Conveyor Handling, PCB Routers, Stencil Cleaners, Ultrasonic Cleaning Systems, Laser Markers, Resistance / Spot Welding etc.

DEN-ON INSTRUMENTS CO., LTD.

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