Industry News: digital i/o (Page 1 of 11)

Virtex-II FPGA Prototyping Boards Enable Complex FPGA Design Evaluation & Testing

Industry News | 2003-06-16 09:12:35.0

Boards tout up to 8MGates devices, on-board RAM, banks of I/O, many programmable user interfaces

SMTnet

Integrated Circuit Systems, Inc. Offers Rambus Yellowstone Memory Interface Clock Generators

Industry News | 2003-06-20 08:31:58.0

Leading chip timing solutions provider manufactures fast memory interface clock generators for high-bandwidth applications

SMTnet

SMTA, Donald Stevens Congress Center, Rosement, IL, September 27-28, Booth # 136

Industry News | 2016-08-13 19:54:46.0

JTAG Technologies return to SMTA in 2016 to premiere several new hardware products for PCB testing and In-System [Device] Programming.

Surface Mount Technology Association (SMTA)

Multi-function JTAG Module Addresses Analogue Testing JTAG Technologies launches the JT 2149/DAF I/O module for digital and analogue measurement

Industry News | 2012-06-20 14:00:03.0

JTAG Technologies, has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analogue/Frequency) measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analogue test access to PCBs via JTAG Technologies’ widely-used QuadPod signal conditioning interface.

JTAG Technologies B. V.

A Bundle of New Ideas in Boundary Scan by Market Leader JTAG Technologies

Industry News | 2014-12-29 11:32:53.0

JTAG Technologies, a leader in innovative boundary-scan (IEEE Standard 1149.1) products delivering a broad line of software and hardware tools for test preparation, test execution, test result analysis, and in-system programming applications will demonstrate the latest solutions at IPC Apex 2015 San Diego at booth # 826 :

JTAG Technologies B. V.

Press Preview for IPC Apex 2016 – Las Vegas, Booth 2413

Industry News | 2016-01-04 18:06:53.0

What test engineers worry about these days: the access to nodes of assemblies with ever increasing complexity is more and more difficult and results in reduced fault coverage.

JTAG Technologies B. V.

In the ramp light in Las Vegas: JTAG Technologies Inside - The future of your ATE application with Boundary-Scan

Industry News | 2016-03-15 15:42:19.0

What test engineers worry about these days: the access to nodes of assemblies with ever increasing complexity is more and more difficult and results in reduced fault coverage.

JTAG Technologies B. V.

Preview for JTAG Technologies for electronica 2014 Munich showgrounds, November 11-14, 2014 Hall A1.221

Industry News | 2014-10-09 11:38:28.0

JTAG Technologies BV will showcase an array of state-of-the-art products in Hall A1.221.

JTAG Technologies B. V.

Preview for JTAG Technologies for electronica 2014 Munich showgrounds, November 11-14, 2014 Hall A1.221

Industry News | 2014-10-13 19:25:24.0

JTAG Technologies BV (Eindhoven, The Netherlands)will showcase an array of state-of-the-art products in Hall A1.221.

JTAG Technologies B. V.

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