Industry News | 2012-01-22 23:16:58.0
More than 350 engineers who attended last week’s IPC webinar, Soldering and Assembly Defects, were polled on their biggest headaches with printed boards, PCB components and PCB assembly process failures. The survey results which identify solder finish, ball grid array (BGA) components and reflow soldering as the greatest challenges, provide webinar co-sponsor, National Physical Laboratory (NPL) of the United Kingdom with useful information as it prepares its NPL Process Defect Clinic for IPC APEX EXPO® 2012.
Industry News | 2018-10-17 20:20:17.0
Datest announces that it was awarded a 2018 Global Technology Award in the category of Test Services for its High-end CT Scanning and Failure Analysis Service. The award was presented to the company during a Tuesday, Oct. 16, 2018 ceremony that took place during SMTA International. This is Datest’s fourth Global Technology Award, having previously been the recipient of this prestigious recognition in 2011, 2013 and 2015.
Industry News | 2017-09-05 16:09:04.0
Datest today announced that its President Robert Boguski will Chair Session TI Keynote & TI3 during SMTA International. The session, entitled, “The Roadmap and the Reaction: Challenges and Responses in Advanced Assembly Technology,” is scheduled to take place Monday, Sept. 18, 2017 from 12:30 – 3 p.m. in Room 48. Speakers for the session include keynote speaker, Bill Bader from iNEMI, John Timmerman, Ph.D. from Henkel and Luis Carlos Montemayor from Dow Corning Corporation.
Industry News | 2018-03-25 13:21:16.0
The widest selection of online webinars in the industry has added more titles
Industry News | 2017-08-10 18:12:22.0
Datest today announced that its President Robert Boguski will present during PCB West on Wednesday, September 13 from 2-3 p.m. The conference is scheduled to take place September 12-14, 2017 at the Santa Clara Convention Center in Calif. Boguski will present “Putting Lipstick on a Minnow: The challenges and the pitfalls of making a small-tech business in the heart of Silicon Valley interesting to interns.”
Industry News | 2018-09-26 11:48:09.0
Datest today announced that it has earned its AS9100D certification. With this milestone, together with the ISO9001:2015 certification, Datest maintains the appropriate, consensus-driven quality benchmarks to serve the aviation, space and defense industries.
Industry News | 2015-01-09 11:28:58.0
Datest, a leading provider of advanced, efficient and mission-critical in-circuit testing, test engineering, and X-ray inspection solutions, will exhibit in Booth #760 at MD&M West, scheduled to take place February 10-12, 2015 at the Anaheim Convention Center in California.
Industry News | 2018-01-11 20:26:26.0
Datest today announced that it will partner with VJ Technologies (VJT) to host a digital X-ray inspection services Open House at the Datest facility in Fremont, CA on Tuesday, Jan. 23, 2018 from 12-6 p.m.
Industry News | 2018-01-16 11:10:53.0
Datest will partner with VJ Technologies (VJT) to host a digital X-ray inspection services Open House at the Datest facility in Fremont, CA on Tuesday, Jan. 23, 2018 from 12-6 p.m. VJT and Datest will be showcasing the newly completed Microfocus CT Lab, along with their other capabilities, giving tours of the facility and providing demonstrations of their products and services. VJT provided the high precision (5-10 micron) micro focus DR/CT system, VJT's world-class Vi3 DR software and Fraunhofer’s VOLEX CT software, and all associated DR and CT workstations.
Industry News | 2017-03-07 19:48:20.0
Datest today announced that it has signed on with Competitive Edge Solutions, LLC as its newest manufacturers’ representative. David Wilson will represent Datest throughout the six New England states (MA, CT, RI, VT, NH, ME). Competitive Edge Solutions has more than 20 years of practical experience in providing industry-leading equipment to exceed its customers’ needs. Lines include Juki Automation Systems, ITW EAE MPM/Electrovert/Camelot, Nordson Test & Inspection Group (DAGE, YESTECH and MATRIX) and now Datest.
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