Industry News: euro ate (Page 1 of 2)

Multitest to Exhibit Latest Technologies at SEMICON Taiwan

Industry News | 2009-08-19 19:57:56.0

Rosenheim, Germany — August 2009 — Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that it will feature the MT2168 system, test socket solutions, and ATE board design services in booth 2602 at the upcoming SEMICON Taiwan exhibition, scheduled to take place September 30-October 2, 2009 at the Taipei World Trade Center in Taipei, Taiwan.

Multitest Elektronische Systeme GmbH

Multitest’s Valts Treibergs and Chris Cuda to Present at BiTS 2010

Industry News | 2010-02-15 19:32:28.0

Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Valts Treibergs and Chris Cuda will present a paper titled “Spring Probe PCB Pad Wear Analysis” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz.

Multitest Elektronische Systeme GmbH

Multitest Introduces Automatic Contactor Cleaning Feature for the MT9510

Industry News | 2009-08-04 14:19:11.0

Rosenheim, Germany — August 2009 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, introduces the new Automatic Contactor Cleaning (ACC) feature for the MT9510, capable of cleaning the contactor fast and without manual interruption of the handling process.

Multitest Elektronische Systeme GmbH

ECT Interface Products Awarded With Plaque of Appreciation

Industry News | 2009-08-06 14:14:33.0

Rosenheim, Germany — August 2009 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that the Multitest business unit “ECT Interface Products” received the “Plaque of Appreciation” from Cypress.

Multitest Elektronische Systeme GmbH

Multitest Appoints Steve Dielman As Regional Manager

Industry News | 2009-08-07 14:40:07.0

Rosenheim, Germany — August 2009 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, is pleased to announce that Steve Dielman is the new Regional Manager for Multitest’s US handler business.

Multitest Elektronische Systeme GmbH

Multitest’s Bernhard Lorenz to Present at SEMICON West 2010

Industry News | 2010-06-23 13:36:30.0

Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Bernhard Lorenz, Director of Engineering, will present a paper titled “Test in Carriers - The New Test Solution” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco.

Multitest Elektronische Systeme GmbH

Multitest’s Günther Jeserer to Hold CAST Workgroup Meeting at SEMICON West 2010

Industry News | 2010-06-28 14:27:53.0

Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Günther Jeserer, Business Unit Manager, will hold a Docking and Mounting Interface Workgroup meeting at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco.

Multitest Elektronische Systeme GmbH

Multitest’s Ryan Satrom to Present at BiTS 2010

Industry News | 2010-02-12 09:54:05.0

Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Ryan Satrom and Valts Treibergs will present a paper titled “An Improved Characterization Technique for Contactors” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/ Mesa Hotel in Mesa, Ariz. The presentation will be held during Session 4, which will take place Tuesday March 9, 2010 at 10:30 a.m.

Multitest Elektronische Systeme GmbH

Multitest’s Tony DeRosa to Present at BiTS 2010

Industry News | 2010-02-17 20:27:31.0

Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Tony DeRosa, product manager, will present a paper titled “New Probe Architecture Performance in High-Volume Production” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz.

Multitest Elektronische Systeme GmbH

Multitest's Günther Jeserer to Present at SEMICON West 2010

Industry News | 2010-06-23 12:15:55.0

Rosenheim, Germany — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Günther Jeserer, Business Unit Manager, will present a paper titled “Improved Cost of Test by Optimized Tester Utilization” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco.

Multitest Elektronische Systeme GmbH

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