Industry News | 2019-01-30 08:13:02.0
The SMTA is pleased to announce the Best Papers from SMTA International 2018. As speakers at SMTA International, individuals make contributions to the industry by sharing their research and findings. For these exceptional achievements, a cash award and plaque are given to all winners.
Industry News | 2014-03-28 09:54:48.0
IPC – Association Connecting Electronics Industries® presented Committee Leadership, Distinguished Committee Service and Special Recognition Awards at IPC APEX EXPO® at Mandalay Bay Convention Center in Las Vegas.
Industry News | 2024-09-23 20:27:15.0
PEMTRON is pleased to announce plans to exhibit at the TPCA Show, scheduled to take place Oct. 23-25, 2024 in Taipei, where it will showcase its latest innovations in inspection equipment. Visitors to Booth will have the opportunity to explore four state-of-the-art systems: POSEIDON, 8800AI, 8800FI and JUPITER, each designed to enhance precision, efficiency and quality control.
Industry News | 2024-09-30 20:02:53.0
PEMTRON is pleased to announce its participation in NEPCON Nagoya 2024, where it will showcase its cutting-edge equipment designed for precision inspection in semiconductor and electronics manufacturing. From October 23-25, visitors to PEMTRON's booth will experience demonstrations of the JUPITER 3D X-ray Inspection System, POSEIDON Wafer Warpage Measurement and FC-BGA Bump Inspection System, APOLLON Package Inspection System, and the 8800WIR Wafer Inspection System.
Industry News | 2020-09-23 11:45:08.0
Amkor Technology invites you to join us at the FREE Electronic Design Process Symposium (EDPS) virtual event September 30-October 1, 2020. EDPS is the leading forum for advanced chip and systems design processes. Amkor's Gerard John, Sr. Director, FCBGA, will present "Using Machine Learning to Optimize Semiconductor Test" on October 1st at 5:50 PM PST.? Abstract: Machine learning (ML) is a field of engineering under the artificial intelligence (AI) umbrella, based on the idea that systems can learn from data, identify patterns and make decisions with minimal human intervention. ML is often used as a prediction tool to perform analysis on large amounts of data, automate analytical model building and provide the user (human, machine or calling function) with event occurrence probability. To date, the test community has not embraced ML and continues to look at ML with skepticism when approached with the paradigm shift - replacing conventional product test suites with a test suite selected by an ML algorithm. This skepticism may be the result of multiple factors, such as limited familiarity with ML, partial awareness of its capabilities, lack of tools that can be easily used and the workload involved in the process of training a machine to discern data. In addition, by running a compressed test suite suggested by ML, questions arise about test escapees and their potential impact on product quality. This talk uses the example of an Open-Short test to shed light on optimizing semiconductor test using ML. For more information and to register for this FREE event, visit the EDPS website
Industry News | 2024-09-16 18:52:11.0
PEMTRON is pleased to announce that its D2 (Dual Lane & Dual Head) Series AOI and SPI system has received a Mexico Technology Award in the category of Inspection Equipment – SPI Systems. The award was announced during a ceremony that took place on Wednesday, September 11, 2024 during SMTA Guadalajara in Mexico.
Industry News | 2011-03-22 16:23:31.0
Ironwood Electronics recently introduced a new BGA socket addressing high performance requirements for BGA devices - CBT-BGA-6014.
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