Industry News | 2003-04-04 08:21:57.0
The deal emphasizes PIAD�s commitment to being a major supplier to the UK printed circuit market and enhances Crossley & Bradley�s position as a leading distributor of copper-clad laminates in the UK
Industry News | 2003-04-25 07:30:58.0
CC Electronics Europe has appointed Wendy Heyes as Sales Director.
Industry News | 2003-06-17 08:07:40.0
The Radiall SMT coupler range now includes the new 14.2 x 5.1mm mini type.
Industry News | 2011-01-14 13:24:05.0
MIRTEC, the Global Leader in Inspection Technology announces that David Bennett has been promoted to President of MIRTEC Europe.
Industry News | 2011-04-20 17:36:31.0
MIRTEC, "The Global Leader in Inspection Technology", announces that it has been awarded a 2011 Circuits Assembly Service Excellence Award in the category of Electronics Suppliers — Test and Inspection for its outstanding customer ratings, as judged by its own customers.
Industry News | 2014-04-15 09:05:08.0
MIRTEC, “The Global Leader in Inspection Technology,” announces that it has named The Murray Percival Company ‘MIRTEC Manufacturers’ Representative Organization of the Year 2013’.
Industry News | 2015-02-25 15:01:07.0
MIRTEC, “The Global Leader in Inspection Technology,” was awarded a 2015 Circuits Assembly Service Excellence Award in the category of Test & Inspection for its outstanding customer ratings, as judged by its own customers.
Industry News | 2018-08-21 20:05:28.0
MIRTEC, ‘The Global Leader in Inspection Technology’, is pleased to announce it has entered into a Technical Collaboration Agreement with YXLON, a company of the Comet Group. This collaboration allows both organizations to explore and expand upon synergistic applications within the SMT Electronics Manufacturing Industry.
Industry News | 2003-02-14 08:35:56.0
Printed Circuit Design & Manufacture: The Resource for Electronic Interconnect Professionals will Launch Its Premier Issue in April 2003
Industry News | 2003-05-21 08:21:19.0
Basic concepts for identifying the relevant contributions to uncertainty, and the calculation of total uncertainty from these contributions
